Celadon
Celadon Systems is a well-established 20 year old US based company known for providing “Peace of Mind” Probing Solutions to the semiconductor industry. Celadon’s probe cards are known for thriving in temperature extremes while still delivering accurate and precise test results. Expect Millions of Touchdowns with Celadon. Celadon delivers the Lowest Cost of Test in the industry. Celadon is an industry leader in parametric probe both in production and in the lab, device test, burn-in, modeling & characterization, and wafer level reliability.
- 952.232.1700
- 952.997.6225
- salesteam@celadonsystems.com
- 13795 Frontier Court
Burnsville,, MN 55337
United States
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High Performance Cables And Accessories
Cables are designed and manufactured by Celadon. Cables are available in lengths custom to the half-meter, and can be manufactured with a variety of industry standard connectors, such as coaxial, triaxial, Type8, Edge 24/48 or 35/70, DSub 9, 15, 25, or 50; or advanced multi-contact. Depending on the overall size of the final product, an anti-abrasion sheath may be used to prevent wire wear.
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Multisite Probe Card
T300 ButtonTile™
The Celadon T300™ probe cards are designed for long-term, multi-site, high-density wafer level reliability or burn-in tests up to 400°C. In today’s economic environment, conventional reliability data is needed quickly while eliminating the cost, electrical stress, and delay of parts packaging while maintaining a wafer performance map.
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Patch Panels
For maximum channel flexibility, Celadon can design and build custom patch panels to meet your WLR requirements.
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Probe Card
VersaTile™
Celadon has reduced the size of a probe card to 28mm with the VersaTile™ with Advanced Cantilever™ technology. The VersaTile™ with Advanced Cantilever™ technology can fit on a conventional 3-hole mount probe positioner for single site probing. The same VersaTile™ with Advanced Cantilever™ technology can be used in a 300mm VersaPlate™ for multi-site probing.
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Probe Card
Indexer™
The patented Indexer™ is the industry’s first automatic probe card changer designed for lights out parametric test.*Can support up to five VC20™’s with Advanced Cantilever™ technology, any variety*Card changes are complete in seconds*Fully programmable*Tested for hundreds of thousands of touchdowns.
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Production Wafer Level Burn-in
TV19 VersaTile™ probe cards are designed with Celadon’s patented ceramic technology for superior electrical performance, yet is highly modular due to it’s 28mm x 28mm chassis. Micro-adjustments can be made in seconds with an allen wrench and a microscope. Easily align VersaTile cards for different wafer layouts using a 4.5” compatible 1×3 , 200mm, or 300mm VersAdjust plate.
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3KV High Voltage Test
45EHV/VC20EHV: 4.5inch High Voltage Motherboard for Celadon Element™ 20mm VC20EHV VersaCore™ and VersaJet™ System
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Cryogenic Applications
Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe card as well as DUT probing solutions. These custom cryogenic probe card solutions are widely used to test Space, Military, Medical and Quantum Computing products. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovative custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cableout designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.
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Cryogenic 4K Probe Cards
Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe cards as well as DUT probing solutions. These Cryogenic probe cards have all the benefits of Celadon’s Crash Resistant™ probe technology but with the ability to probe as cold as humanly possible. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovate custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cable-out designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.
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Probe Card
VC43™/VC43EAF™
VC43™/VC43EAF™ probe cards offer a larger format version of the popular VC20. In addition to saving time, another advantage of the modularity is the ability to leave the interface in place and simply install the VC43™ topside using Celadon’s twist and lock insertion tool which minimizes the possibility of triboelectric or interconnect issues that can occur during typical probe card changes. The VC43™ can be used for production parametric test, modeling, characterization, and wafer level reliability testing. Cards can be configured up to 104 probes in either single or dual layer with near vertical probes to minimize scrub lengths on pads allowing the VC43s to probe pads as small as 30 microns.
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Probe Card
T90™ Series
The 90 mm tile was designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.
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Diagnostic Cores
Diagnostic VersaCore™
The diagnostic cores are uniquely designed in the VC20™ with Advanced Cantilever™ technology format. Using the customizable PCB, components can be added to create a “golden core” to quickly troubleshoot your system*Test SMUs*Test Motherboard*Test Pogo pins*Test Relay matrix
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Probe Cards
Minitile™ with Advanced Cantilever™ technology and WedgeTile™
Each probe is designed for wide temperature ranges and so the probe expansion characteristics are closely matched to the wafer’s expansion characteristics. This allows the user to take a fast measurement while a system is in a settling or thermal stabilization mode and helps compensate for wafer expansion.
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Probe Card
T40™ Series
Ultra low noise and fast settling modeling and characterization tests are made possible by Celadon’s patented ceramic probe cards.
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Probe Card
VC20E Lab
*20 millimeter ceramic probe card*Optimized for DC parametric test, modeling and characterization, and single site WLR*Can be quickly installed using an interface tool into various interfaces and takes minimal storage space on the test floor*Effective operating temperature range from -65° to 200° C*Leakage as low as 5fA/V. If you require faster settling time, click here*Can be configured with up to 48 probes
Parent
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MPI Corp.
MPI Corporation was founded in July, 1995 and has enjoyed growth well beyond the industry standard due to an infusion between customer centricity, the latest technology development, advanced manufacturing techniques and world class customer support. In addition, having four vertical markets spanning across many different industries has enabled MPI steady growth.
Siblings
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Celadon Systems, Inc.
Celadon Systems, Inc. based in Apple Valley, Minnesota, is a worldwide leader in high performance probing solutions for monitoring DC parameters of semiconductor devices at the wafer level.
Siblings
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MPI Photonics Automation
MPI Photonics Automation (PA) Division is the world’s leading manufacturer of automated test and measurement equipment for the Photonics, Optoelectronic, Semiconductor, and Laser industries. MPI’s leading-edge technology enables a global installation base of more than 10,000 photonics systems worldwide operating 24/7.
Siblings
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MPI Probe Card Technology
MPI probe card division provides a wide range of solutions to the semiconductor wafer level test market. Integrated Circuit (IC) applications include Drivers, Logic, CIS, RF, Flip Chip and Cu Pillars. MPI’s comprehensive designs, robust manufacturing and state-of-the-art tooling, enables MPI to provide unsurpassed solutions globally for your challenges both today and for many generations to come.
Siblings
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MPI Advanced Semiconductor Test
The Advanced Semiconductor Test (AST) division is built based upon a unique combination of *Manufacturing Excellence and *Systems Reliability incorporated from MPI’s worldwide market leadership position in LED Test Equipment with a global installed base of more than 10,000 systems for 24/7 operation and *Decades of Engineering probe systems Market Expertise from the AST management team.
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MPI Thermal Test Systems
MPI Thermal temperature systems have advanced technology in precise localized hot and cold temperature test equipment. The thermal division has 60 years of combined thermal control system experience. This has brought about a thermal air stream system for today’s manufacturers environmental test chamber needs. We have designed a system that provides accurate temperature control at the test site as a convenient alternative to larger temperature chambers and liquid baths.
