NEOSEM TECHNOLOGY INC
A leading provider of testing and measurement solutions for technology manufacturers. The company’s products are used to conduct standardized, repeatable testing solutions of storage-related devices such as HDDs, SSDs ODDs and PCIe drives.
- 031-8091-8800
- 031-8091-8850
- sales@neosemtech.com
- 12-26, Simin-daero
327beon-gil
Dongan-gu, Anyang-si, Gyeonggi-do 14055
Korea, South
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product
LED Test
Neosem developed and released the LX500 - LED Accelerated Aging Tester to provide our customers with the capability to deliver highly reliable automotive LED products to the market. By adopting Neosem’s patented temperature control algorithm, the customer can execute the LED device aging test at very stable temperatures.
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Memory Burn-In Test
The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies.
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DRAM Module Test
We provide our customers with Automated SLT (System Level Test) Solutions for DRAM Module HVM test. Our solution gives our customers the best possible combination of technologies for the best performances and manufacturing effiencies - increasing yield, reducing cost of ownership and accelerating time-to-market.
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SSD Test System
The Neosem’s SSD test system combines advanced SSDtest hardware, software and environmental chamber into a single platform and supports all popular storage interfaces including PCIe, SAS & SATA and fast emerging protocols such as NVMe and AHCI.