Test Evolution Corporation
Designed ATE test systems and instruments along with building and managing a profitable test business.
- 617-312-6292
- info@testevolution.com
- 102 South Street
Hopkinton, MA 01748
United States
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Device Power Supply
DPS12
The DPS12 is an AXIe 3.1 compliant DC instrument board that provides 12 channels of flexible device power supply and measurement capability. Each board is organized as two banks of six channels where each bank can be programmed to one of three ranges
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CIF – System Module
The CIF is an AXIe 3.1 compliant instrument board that provides the complete system interface and test system infrastructure, including advanced test feature support.
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EV518 Test System
The EV518 test system leverages AXIe and PXI/PXIe standards to provide high end semiconductor ATE performance in a compact, low-cost, industry standards based form factor. With support for a wide range of digital, analog and RF instrumentation, the EV518 is perfectly suited for post-silicon validation and characterization as well as multi-site production test of consumer digital and wireless devices. Low latency, high speed PCI/PCIe infrastructure, combined with industry leading settling times, give the EV518 exceptionally fast test times and high parallel test efficiency.
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Digital Subsystem
DD48
The DD48 is a self-contained, single slot AXIe 3.1, 48 channel mixed-signal digital test subsystem. Each DD48 has an independent sequencer controller with pattern generators, and an independent per-channel timing system. Integrated timing generators connect directly to the instrument’s pin electronics. Each board can operate independently or synchronously with other DD48 cards.
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Semiconductor Test Solutions Test System
EV500
The EV500 Test System is the industry’s first self-contained tester based on the AXIe standard. It provides all of the power, cooling, and device loadboard interfacing required for up to 5 AXIe instrument cards. The EV500 can be used as a standalone test system or as a rack mountable subsystem upgrade for existing test systems. Device loadboards use high-density direct connections to the AXIe instrument cards and can easily be interchanged as required for different devices.
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EV1018 Test System
The EV1018 test system leverages AXIe and PXI/PXIe standards to provide high-end semiconductor ATE performance in a compact, low-cost, industry standards based form factor. With support for a wide range of digital, analog and RF instrumentation, the EV1018 is perfectly suited for post-silicon validation and characterization as well as multi-site production test of consumer digital and wireless devices. Low latency, high speed PCI/PCIe infrastructure, combined with industry leading settling times, give the EV1018 exceptionally fast test times and high parallel test efficiency.
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Semiconductor Test Services
Test Evolution’s engineering team has developed instrumentation as well as complete systems for other commercial ATE manufacturers for many years. Lab characterization and production test can sometimes require customized solutions ranging from individual instruments and subsystems to full blown systems.
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Intelligent Instruments for Rapid Validation
TEV Intelligent Instruments take protocol testing to the next level, adding features that allow complex functional testing, randomized (write once, run many) test cases, and functional coverage. Coupled with a robust programming environment that supports these features, and detailed debugging information, TEV Intelligent Instruments allow quick bring up and regressions for a quality customer product.
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Custom Integration
All EV-Series test systems are built with expansion and customization in mind. This starts with an extruded aluminum frame which can be customized for 19″ rack mounting. The internal mechanics were designed to make it easy to add new cabling, including the ability to cleanly route these new signals to the standard EV-series testhead connectors.
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AXIe Instruments
TEV AXIe Instruments are compatible with the EV series of test systems from TEV as well as the RF AX series of testers marketed through our partner Cobham Wireless (formerly AeroFlex).
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Semiconductor Test Solutions
EV Series
Test Evolution’s EV-series platform builds on open industry standards such as PXI, AXIe and PCIe that enable creation of low cost, high performance systems.
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PCIe, AXIe and PXI
Well established, proven platforms, Excellent price/performance, Extensive ecosystem of suppliers, Scalable from desktop to bench to production floor
