Test Evolution Corporation
Designed ATE test systems and instruments along with building and managing a profitable test business.
- 617-312-6292
- info@testevolution.com
- 102 South Street
Hopkinton, MA 01748
United States
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PCIe, AXIe and PXI
Well established, proven platformsExcellent price/performanceExtensive ecosystem of suppliersScalable from desktop to bench to production floor
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AXIe Test Software
Test Evolution EV-Series testers use a Windows PC-based controller with a flexible, robust test software environment
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Post Silicon Validation Solutions
Post-silicon validation (PSV) of first silicon tends to be an ad hoc process, stitching together protocol testers from various manufacturers to create test cases and debug issues. While IC’s are getting to market, the process is far from ideal. Leveraging the tools and methodology of pre-silicon verification into post-silicon validation is a key enabler to higher productivity. Test IP-based PSV is a paradigm shift from the way post-silicon validation is currently done. Individual protocol testers, scopes, miscellaneous equipment from various vendors, and on-chip logic are cobbled together in an attempt to create meaningful stimulus, response checking, and debugging.The problems with these ad hoc solutions:Protocol boxes from multiple vendors generally do not work together well. Each has its own driver software, programming model and debugging tools.Tool flows from pre-silicon to post-silicon to production and back are nonexistent. This makes writing tests challenging and thus generally limited in robustness. Also, debugging suspected problems is difficult across more than one interface.
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Portable Stimulus Validation Methodology
PSVM™ is an efficient, directed random, repeatable and self checking validation methodology that allows test portability between pre-silicon and post-silicon platforms. It unites all commonly used pre-silicon verification techniques and idioms with the post silicon validation field:UVM “like” class structure and flowConstrained/Directed random test casesHighly repeatable test cases (seed & time based)Robust event synchronization method for creating complex test casesFully self-checking and regressable test suitesStandardized logging and error reportingDebug of failing tests (transaction flow & waveforms) using 3rd party GUI debuggers like Synopsys Verdi / Protocol AnalyzerHierarchical approach allowing integration of interface and sub-system tests into system levelIntegration of 3rd party instruments (e.g. Lauterbach debugger, DC measurement)Well documented APIs and examples
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Device Power Supply
DPS12
The DPS12 is an AXIe 3.1 compliant DC instrument board that provides 12 channels of flexible device power supply and measurement capability. Each board is organized as two banks of six channels where each bank can be programmed to one of three ranges
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Instruments for Rapid Validation
TEV Intelligent Instruments take protocol testing to the next level, adding features that allow complex functional testing, randomized (write once, run many) test cases, and functional coverage. Coupled with a robust programming environment that supports these features, and detailed debugging information, TEV Intelligent Instruments allow quick bring up and regressions for a quality customer product.
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CIF – System Module
The CIF is an AXIe 3.1 compliant instrument board that provides the complete system interface and test system infrastructure, including advanced test feature support.
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Semiconductor Test Solutions
Test Evolution’s EV-series platform builds on open industry standards such as PXI, AXIe and PCIe that enable creation of low cost, high performance systems.
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Digital Subsystem
EV100-DD192
The DD192 is a self-contained, single slot AXIe 3.1, 192 channel mixed-signal digital subsystem. Each DD192 has four sequencer controllers with pattern generators, and integrated timing generators connected to integrated pin electronics.
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EV518 Test System
The EV518 test system leverages AXIe and PXI/PXIe standards to provide high end semiconductor ATE performance in a compact, low-cost, industry standards based form factor. With support for a wide range of digital, analog and RF instrumentation, the EV518 is perfectly suited for post-silicon validation and characterization as well as multi-site production test of consumer digital and wireless devices. Low latency, high speed PCI/PCIe infrastructure, combined with industry leading settling times, give the EV518 exceptionally fast test times and high parallel test efficiency.
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Custom Integration
All EV-Series test systems are built with expansion and customization in mind. This starts with an extruded aluminum frame which can be customized for 19″ rack mounting. The internal mechanics were designed to make it easy to add new cabling, including the ability to cleanly route these new signals to the standard EV-series testhead connectors.
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Digital Subsystem
DD48
The DD48 is a self-contained, single slot AXIe 3.1, 48 channel mixed-signal digital test subsystem. Each DD48 has an independent sequencer controller with pattern generators, and an independent per-channel timing system. Integrated timing generators connect directly to the instrument’s pin electronics. Each board can operate independently or synchronously with other DD48 cards.
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Semiconductor Test Solutions Test System
EV500
The EV500 Test System is the industry’s first self-contained tester based on the AXIe standard. It provides all of the power, cooling, and device loadboard interfacing required for up to 5 AXIe instrument cards. The EV500 can be used as a standalone test system or as a rack mountable subsystem upgrade for existing test systems. Device loadboards use high-density direct connections to the AXIe instrument cards and can easily be interchanged as required for different devices.
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EV1018 Test System
The EV1018 test system leverages AXIe and PXI/PXIe standards to provide high-end semiconductor ATE performance in a compact, low-cost, industry standards based form factor. With support for a wide range of digital, analog and RF instrumentation, the EV1018 is perfectly suited for post-silicon validation and characterization as well as multi-site production test of consumer digital and wireless devices. Low latency, high speed PCI/PCIe infrastructure, combined with industry leading settling times, give the EV1018 exceptionally fast test times and high parallel test efficiency.
