Novtek Test Systems
Since 1986, Novtek has been developing NVM test equipment for production wafer sort, engineering characterization, and QA/Reliability requirements. We designed and manufactured the first FLASH memory endurance cycling system, a market we still dominate worldwide.
- 408-441-9934
- 408-441-1119
- sales@novtek.com
- 2766 Coltwood Dr.
San Jose, CA 95148
United States
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FLASH Memory Endurance Cycling Systems
NTS3700 Series
FLASH memory endurance cycling systems are used to characterize and qualify the write/erase cycling endurance of FLASH memory devices, and to conduct functional testing of memory devices at extreme temperatures. A typical system consists of an environmental chamber, algorithmic pattern generator, programmable power supplies and system controller.Novtek’s systems can accommodate from 64 to 864 devices for parallel devices and . In addition to FLASH, the systems can also accommodate MRAM, EEPROM, EPROM, PROM (OUM), Mask ROM, SRAM, FeRAM, DRAM, PC Cards (PCMCIA), embedded FLASH microcontrollers and NVM based FPGA. The system's environmental chamber has a range of -55oC to +200oC and is ideal for temperature characterization of memory based devices and packages.
