Showing results: 16 - 30 of 150 items found.
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Chroma ATE Inc.
Applicable for burn-in, reliability andlife testingACC and APC control modesIndividual channel driving and measurementDriving current 500mA per channel
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Chroma ATE Inc.
Test and packing speeds from 80ppm to1,800ppmStandard functions - Inductance/quality factor test - Winding resistance test - Polarity testOptional functions - Layer short test - Insulation resistance test - Bias current testCircular vibrating plate design feeds inductors steadily and rapidlyIndex disc design eliminates dropped inductorsFour-wire measurement test socket designAutomatic discharge mechanism when feeding errors occurEach test station has an independent NG (No Good) product collection boxTest without packaging function provided, good products gathered in bulk collection boxExclusive data collection software designed for monitoring product quality in real timeReserved stations for number spraying and automatic optical inspectionSwitchable Chinese/English/Japanese operating interfaceEquipment is fast, stable and safe
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A222917 -
Chroma ATE Inc.
Chroma A222917 is a multi-functional PCBA main board board signal test device for display. It has ultra high speed LVDS (Low -voltage differential signaling) as image signal analysis core to provide high efficiency and stability test quality.
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7210-P -
Chroma ATE Inc.
Chroma 7210-P is an inspector to examine solar cells during metallization process. Its small dimension design can be easily installed on the metallizing rotary table. The defects on the c-Si PV cells that caused by front-side (sunny-side) printing process may affect the performance, reliability and appearance.
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61800 Series Optional Function -
Chroma ATE Inc.
The regenerative AC load function consists of various modes such as CC Rectified mode, CP Rectified mode, CR mode, CC Phase lead/lag mode and CP Phase lead/ lag mode. The Rectified Mode is capable of simulating non-linear rectified loads with characteristics similar to Chroma 63800 series AC load where the voltage and current operate at the 1st and 3rd quadrant. The Rectified Mode supports both CC and CP functions with current, power and CF as parameter settings.
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62000H-S series -
Chroma ATE Inc.
The latest programmable solar array simulator power supply 62000H-S Series released by Chroma provide simulation of Voc (open circuit voltage) up to 1800V and Isc (short circuit current) up to 30A. The 62000H-S provides an industry leading power density in a small 3U high package. The solar array simulator is highly stable and has a fast transient response design, which are both advantageous to MPPT performance evaluation on PV inverter devices. The 62000H-S Series have many unique advantages including high speed & precision digitizing measurement circuits with a 100kHz A/D, 25kHz D/A controlled I-V curve and a digital filter mechanism. It can simulate an I-V curve accurately and response the mains ripple effect from the PV inverter. In addition, the built-in EN50530/Sandia SAS I-V model in the standalone unit can easily program the Voc, Isc, Vmp, and Imp parameters for I-V curve simulation, without a PC controller.
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7213-AD -
Chroma ATE Inc.
Defects causes by back-side printing process of C-Si PV cells will also cause performance, reliability impact. Among all the back-side printing defects, bumps caused by improper printing may cause high cell breakage rate during lamination of c-Si module process.
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7212-HS -
Chroma ATE Inc.
Chroma 7212-HS is a linescan AOI inspector used to provide superior PV cells defect inspection. As the fine grid printing process goes even faster than before, a reliable printing quality inspector is inevitable to reduce the cost during the PV cells metallization.
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7210 -
Chroma ATE Inc.
The Croma 7210 has built two functions which are color sorting and printing inspection in one structure. With the compact "2 in 1" design, it not only optimizes the floor space but also maximizes the performance.
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7231 -
Chroma ATE Inc.
Sawmarks happened during the wafering process because of the impurities or vibration of the wires. It happens sometimes in near the edge and sometimes in the center. By following the British standard of EN 50513 2009, Chroma is able to provide the solution that also sense the sawmarks in the center.
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7201 -
Chroma ATE Inc.
The Chroma 7201 was designed to measure wafer lengths, widths, diagonal, orthogonal and chamfer size and angle, it is also capable to detect surface stains. User friendly software and GUI enable versatile parameter setting and result, it also provides a defect display and storage function for further analysis or potential MES/CIM integration.