Chroma ATE Inc.

Founded in 1984, Chroma ATE Inc. is a world leading supplier of precision test and measurement instrumentation, automated test systems, intelligent manufacturing systems, and test & automation turnkey solutions marketed globally under the brand name "Chroma". Significant markets served by Chroma include semiconductors, photonics, LED, photovoltaics, video & color, flat panel displays, power electronics, passive components, electrical safety, green batteries, electric vehicles, thermoelectrics, automated optical inspection and intelligent manufacturing systems for ICT and cleantech industries.

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  • +886-3-327-9999
  • +886-3-327-8898
  • info@chromaate.com
  • No. 88, Wenmao Rd
    Guishan Dist
    Guishan, Taoyuan 333001
    Taiwan
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Showing results: 76 - 90 of 150 items found.

  • FPD Tester

    2918 - Chroma ATE Inc.

    The 2918 FPD tester provides 8k Super Hi-Vision (7680x4320/ 8192x4320) for testing Full 8k@60/120 Hz resolution (32/64 lane V-by-one) is supported by one tester.

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  • FPD Tester Signal Module

    A040209-05-04 - Chroma ATE Inc.

    A040209-05-04 is a MIPI signal module board and complies with the MIPI DSI v1.2 / MIPI D-PHY v1.1 signal specifications and standards. A040209-05-04 is used with the FPD Tester and can be applied to MIPI Display testing, providing MIPI Panel standard signal and other related controls.

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  • FPD Tester Power Module

    67393-120-480 - Chroma ATE Inc.

    The 67393-120-480 FPD Tester Power Module is a new generation of small, stable, high reliability AC to DC power supply. It adopts compact mechanical design and uses Chroma FPD Tester for signal input/output that can provide a total solution for testing the signal, control and power of diversified panels.

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  • FPD Tester Model

    27014 - Chroma ATE Inc.

    Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.

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  • Hipot Tester

    19052/19053/19054 - Chroma ATE Inc.

    The Chroma Hipot Tester 19050 series provide 3 models for choice. The 19052 for AC/DC/IR Hipot testing and insulation resistance (IR) measurements, the 19053 which combines both AC and DC Hipot tests and IR measurements with 8HV scan channel capability into a single compact unit, and the 19054 which combines both AC and DC Hipot tests and IR measurements with 4HV scan channel capability into a single compact unit.

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  • Hipot Analyzer

    19056/19057 - Chroma ATE Inc.

    Chroma 19056/19057 Hipot Analyzer is an equipment specially designed for testing and analyzing ultra-high withstand voltage.

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  • LED Load Simulator

    63110A/ 63113A/63115A - Chroma ATE Inc.

    As shown on the V-I curve in figure 1, the LED has a forward voltage VF and a operating resistance (Rd). When using a resistor as loading, the V-I curve of the resistor is not able to simulate the V-I curve of the LED as shown in blue on figure 1. This may cause the LED driver to not start up due to the difference in V-I characteristic between the resistors and the LEDs. When using Electronic Loads, the CR and CV mode settings are set for when the LED is under stable operation and therefore, is unable to simulate turn on or PWM brightness control characteristics. This may cause the LED driver to function improperly or trigger it’s protection circuits. These testing requirements can be achieved when using a LEDs as a load; however, issues regarding the LED aging as well as different LED drivers may require different types of LEDs or a number of LEDs. This makes it inconvenient for mass production testing.

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  • PCBA Pattern Analyzer

    A222918 - Chroma ATE Inc.

    The test method in the PCBA mainboard production line today mainly depends on the operator judgment. It is "subjective" testing and the accuracy decreased when the operator works for a long time.

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  • OLED Lifetime Test System

    58131 - Chroma ATE Inc.

    The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.

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  • Multi-Functional Optical Measuring System

    7505-05 - Chroma ATE Inc.

    Recent advancement in optical inspection technology continues to find its path into a variety of market applications. Innovative automated optical testing has become essential and indispensable in areas such as effective dimensional measurement to ensure product manufacturability and process control.

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  • Photonics Module Test System

    58625 - Chroma ATE Inc.

    Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.

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  • Programmable DC Electronic Load

    63000 Series - Chroma ATE Inc.

    The 63000 Series programmable DC electronic loads are reliable, precision instruments primarily designed to test switching power suppl ies, A/D power suppl ies, power electronic components, adapters, 3C batteries and chargers. Its maximum 350W rated power makes it suitable for testing numerous types of lower power devices. The 63000 Series offers models in two operating voltages 150V models, with 250W and 350W power levels up to 60A in a single unit. Their compact and light weight design make these loads easy to move around which is ideal for R&D and design validation. Each model of the 63000 Series has unique user-def ined waveform (UDW) funct ion capable of simulating real-world custom waveforms. In addition, a data storage function has been built in for saving and recalling up to 100 stored settings at any time. For automated testing, these save and recall functions can save a great deal of time. The 63000 Series has 3 power ranges that can precisely measure the voltage and current in real time. Since short circuit testing is a critical test item, the 63000 provides short circuit simulation to effectively address application demands for power and automated testing.

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  • Programmable DC Electronic Load - (Economical)

    63200E Series - Chroma ATE Inc.

    The 63200E series are high power DC loads that include a choice of three operating voltages, 150V, 600V and 1,200V, with power levels from 2kW to 24kW and up to 2,000A in a single unit. Power levels can increase up to 240kW when multiple units are paralleled.These high power loads are designed for testing a wide range of EV products including DC charging stations, car battery discharge, on board charger power components, and other power electronics components. With its high power capabilities, parallel control and dynamic synchronization functions make this load ideal for automotive batteries, fuel cells and more. The 63200E load's master/slave control application enables units with the samevoltage specification to be used in parallel and synchronized dynamically to meet the power testing requirements. In addition, a 255-set data storage function has been built-in for recall of the stored settings at any time. When used in automated testing, the save and recall functions can save a great deal of time.

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  • Wireless Test Solutions

    Chroma ATE Inc.

    Adivic/Chroma Group has been in the development of RF & Wireless test solutions for more than a decade. Take RF Recorder as an example, it has been adapted by all major Japanese & Korean automotive brand names such as Mitsubishi, Honda, Hyundai,.. ,most of the global IC design houses with DTV chips, and also military entities in NATO. With the same customer-proved Software Defined Radio architecture, we have introduced Wi-Fi, Bluetooth tester since 2014. It will soon cover other current/future wireless standards such as 4G/LTE, 802.11ax, 802.11ah, etc.

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  • VLSI Test System

    3380P - Chroma ATE Inc.

    The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.

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