Chroma ATE Inc.

Founded in 1984, Chroma ATE Inc. is a world leading supplier of precision test and measurement instrumentation, automated test systems, intelligent manufacturing systems, and test & automation turnkey solutions marketed globally under the brand name "Chroma". Significant markets served by Chroma include semiconductors, photonics, LED, photovoltaics, video & color, flat panel displays, power electronics, passive components, electrical safety, green batteries, electric vehicles, thermoelectrics, automated optical inspection and intelligent manufacturing systems for ICT and cleantech industries.

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  • +886-3-327-9999
  • +886-3-327-8898
  • info@chromaate.com
  • No. 88, Wenmao Rd
    Guishan Dist
    Guishan, Taoyuan 333001
    Taiwan
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Showing results: 91 - 105 of 150 items found.

  • LCM Tester

    Model 27012 - Chroma ATE Inc.

    To meet the high accuracy and low price requirements for LCM TV test device, Chroma 27012 that integrates the signal and power source provide a complete test solution for LCD Module. Its LVDS, TTL (Option) signal source fully complies with the digital signal standard, meanwhile with the 24V, 12V, 5V, 3.3V DC source output it is able to supply power to VDD, Backlight for LCM test without obtaining external power source. Equipped with the interface of single key to switch the Timing, Pattern and Program rapidly for test in auto or manual mode, the 27012 is able to provide a direct and convenient test environment for LCM TV by its complete hardware configuration and easy operation.

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  • Partial Discharge Tester

    19501-K/19500 - Chroma ATE Inc.

    Chroma 19501-K partial discharge tester combines hipot test and PD (partial discharge) detector functions in one instrument. The device is capable of a maximum 10kV AC output with leakage current measurement range of 0.01uA and a minimum partial discharge detection of 1pC. The tester is specifically developed to test high voltage semiconductor components and high insulation materials.

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  • LED Power Driver ATS

    8491 - Chroma ATE Inc.

    1. DC Electronic Load : Chroma 6310A/6330A Series2. Transducer Unit/Module*1 : Chroma A849101/A849102, A849103, A8491043. Time/Noise Analyzer : Chroma 80611 & 80611N card4. Sytem Controller*2 : Industrial PC5. DC Source: Chroma 62000P Series6. Digital Power Meter : Chroma 66200 Series7. OVP/Short Circuit Tester : Chroma 806128. ON/OFF Controller : Chroma 80613*1 : A849101 transfers UUT output signal to voltage signal, and measure by 84911 LED power driver measurement card (200kHz). The optional 80611N Noise card is required for 20MHz ripplecurrent measurement.*2 : The controller includes both 84911 LED Power Driver measurement card and 84903 control card.- 84911: Measure rms current, dimming current/frequency/duty, timing, power & ripple current (200kHz)- 84903 : Provide BL control signal(DC level, PWM, SM bus), and enable ON/OFF signal.C Source : Chroma 6500/61500/61600 Series

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  • Electrical Safety Test Solutions

    Chroma ATE Inc.

    Hipot Analyzers with 500VA output rating can be used to test and analyze the withstand voltage of high power and leakage current for the products like motor stators and rotors with high parasitic capacitance. Corona detection can be used for turn-to-turn or turn-to-ground test to avoid winding insulation failure from corona discharge.

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  • Automatic Test System

    Chroma ATE Inc.

    Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.

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  • SoC Test System

    Chroma ATE Inc.

    Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.

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  • VLSI Test Systems

    Chroma ATE Inc.

    50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P

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  • TO-CAN Package Inspection System

    7925 - Chroma ATE Inc.

    Chroma 7925 is an automatic inspection system for TO-CAN package. The appearance defects over 30 um like lens scratch, partial are clearly conspicuous by using advanced illumination technology. Because the height variation of tray and package exists, Chroma 7925 can calculate the focus distance and compensate to overcome the variation with auto focus function.

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  • VLSI Test System

    3380P - Chroma ATE Inc.

    The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.

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  • VLSI Test System

    3380D - Chroma ATE Inc.

    The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.

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  • VLSI Test System

    3380 - Chroma ATE Inc.

    The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.

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  • Wafer Chip Inspection System

    7940 - Chroma ATE Inc.

    Chroma 7940 wafer chip inspection system is an automated inspection system for postdiced wafer chip inspection.

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  • Solar Array Simulator

    62000H-S series - Chroma ATE Inc.

    The latest programmable solar array simulator power supply 62000H-S Series released by Chroma provide simulation of Voc (open circuit voltage) up to 1800V and Isc (short circuit current) up to 30A. The 62000H-S provides an industry leading power density in a small 3U high package. The solar array simulator is highly stable and has a fast transient response design, which are both advantageous to MPPT performance evaluation on PV inverter devices. The 62000H-S Series have many unique advantages including high speed & precision digitizing measurement circuits with a 100kHz A/D, 25kHz D/A controlled I-V curve and a digital filter mechanism. It can simulate an I-V curve accurately and response the mains ripple effect from the PV inverter. In addition, the built-in EN50530/Sandia SAS I-V model in the standalone unit can easily program the Voc, Isc, Vmp, and Imp parameters for I-V curve simulation, without a PC controller.

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  • Regenerative Battery Pack Test System

    17020 - Chroma ATE Inc.

    Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.

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  • OLED Lifetime Test System

    58131 - Chroma ATE Inc.

    The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.

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