Showing results: 106 - 120 of 150 items found.
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17040E -
Chroma ATE Inc.
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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7505-K007 -
Chroma ATE Inc.
The Chroma 7505-K007 Thin Film Thickness Automated Optical Metrology System equipped with 3D sensor is suitable for Roll to Roll processing and thin film thickness measurement. The stage embedded with vacuum adsorption function, making soft UUT a flat surface.
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58635 -
Chroma ATE Inc.
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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3380D -
Chroma ATE Inc.
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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3380 -
Chroma ATE Inc.
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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7940 -
Chroma ATE Inc.
Chroma 7940 wafer chip inspection system is an automated inspection system for postdiced wafer chip inspection.
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58131 -
Chroma ATE Inc.
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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17000 series -
Chroma ATE Inc.
Chroma 17000 series is specifically designed for the formation of Lithium Ion and Lithium Polymer secondary batteries. The 17000 series is a complete turn-key system, including carrier trays, robust battery probe contacts, high quality charge/discharge modules and intuitive software all under computer control. Patented Battery Voltage Tracking (BVT) DC-DC conversion power modules minimize power consumption in battery charging, and Energy Recycle Modules (ERM) recycle the discharged energy directly back to the DC power system for increased power efficiency. These power saving designs provide a planet friendly solution along with cost savings by reducing energy consumption. The intuitive software provides a flexible selection in the charge/ discharge channel, current rating, and modules under test. These features allow the Series 17000 to be used for final cell development, pilot line production, high volume production and ongoing reliability monitoring/quality control.
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66205 -
Chroma ATE Inc.
The 66205 is the 2nd generation of the 66200 series power meter designed specifically for single channel measurement. Its state of art design is capable of providing highly accurate power measurements to meet the requirements of IEC 62301/EN50564 standards. Functionality improvements of the 66205 increase power measurement capabilities to a wider range of applications. The Smart Range function is one of the most important new features added to the 66205 power meter. Smart Range allows the power integration mode to perform active power measurements with the measurement range in auto mode. Chroma’s proprietary design automatically selects the appropriate range, based on changes in sensed voltage and current, ensures the best accuracy when integrating the measurements over time. The 66205 provides 10 selectable current measurement ranges from 5mA up to 30A. External sensor options A662017~A662020 are available to increase the current measurement range. Six selectable voltage ranges are available up to 600V.
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63110A/ 63113A/63115A -
Chroma ATE Inc.
As shown on the V-I curve in figure 1, the LED has a forward voltage VF and a operating resistance (Rd). When using a resistor as loading, the V-I curve of the resistor is not able to simulate the V-I curve of the LED as shown in blue on figure 1. This may cause the LED driver to not start up due to the difference in V-I characteristic between the resistors and the LEDs. When using Electronic Loads, the CR and CV mode settings are set for when the LED is under stable operation and therefore, is unable to simulate turn on or PWM brightness control characteristics. This may cause the LED driver to function improperly or trigger it’s protection circuits. These testing requirements can be achieved when using a LEDs as a load; however, issues regarding the LED aging as well as different LED drivers may require different types of LEDs or a number of LEDs. This makes it inconvenient for mass production testing.
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61800 series -
Chroma ATE Inc.
Market demand for Distributed Resource (DR) products such as PV inverters and wind energy systems is steadily growing as the world strives for clean renewable energy sources. This demand has created a need for rigorous regulation testing to standards such IEEE 1547 / IEC 61000-3-15 / IEC 62116 ensuring proper and safe operation of on-grid products. It has become critical to manufacturers to conduct these tests to prove compliance and to relieve product liability concerns. Chroma’s new 61800 family of Grid Simulators has been designed to fulfill these test requirements by providing a full 4 quadrant, fully regenerative, grid simulator with advanced features for compliance, safety and product verification testing.
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Chroma ATE Inc.
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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3680 -
Chroma ATE Inc.
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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A170202 -
Chroma ATE Inc.
For the products developed to connect batteries for use, if the battery is not ready or unable to be provided due to high cost, the 17020 battery simulator can be used to confirming the product functions during development. The applications of battery simulator include motor drives within the car system, OBC, D-D convertor or charger within the CSS system and products of DC bus, etc.
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7200 -
Chroma ATE Inc.
Among several factors for PV to achieve grid-parity, Reliability of the PV Modules plays an important role. Since its known that some of the cell defects such as edge chips/ flakes, bumps of cell surface were proved to be source of infant mortality of the c-Si PV modules, therefore, to detect those defects is very important for c-Si cell manufacturers.