Chroma ATE Inc.

Founded in 1984, Chroma ATE Inc. is a world leading supplier of precision Test and Measurement Instrumentation, Automated Test Systems, Manufacturing Execution Systems and Turnkey Test and Automation Solutions marketed globally under the brand name "Chroma".

  • +886-3-327-9999
  • +886-3-327-8898
  • 66 Huaya 1st Road
    Guishan, Taoyuan 33383

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Showing recent results 1 - 15 of 112 products found.

  • High Speed PXIe Digital IO Card

    33010 - Chroma ATE Inc.

    Chroma 33010 is a high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.

  • Hipot Tester / Safety Tester

    Chroma ATE Inc.

    Hipot Analyzers with 500VA output rating can be used to test and analyze the withstand voltage of high power and leakage current for the products like motor stators and rotors with high parasitic capacitance. Corona detection can be used for turn-to-turn or turn-to-ground test to avoid winding insulation failure from corona discharge.

  • Hybrid PV Inverter Test Solution

    Chroma ATE Inc.

    5kW/10kW/15kW/up to 1MWFast Transient Response Solar Array SimulationBuild-in Dynamic MPPT Test Profile for EN50530/ Sandia / CGC-GF004/NB-T32004

  • LED Total Power Test System

    Chroma ATE Inc.

    High test speed: complete whole test within 25ms(selected test items).Super stable of temperature variation.Support high voltage and high power LED test requirement.

  • LED Load Simulator

    63110A/ 63113A/63115A - Chroma ATE Inc.

    As shown on the V-I curve in figure 1, the LED has a forward voltage VF and a operating resistance (Rd). When using a resistor as loading, the V-I curve of the resistor is not able to simulate the V-I curve of the LED as shown in blue on figure 1. This may cause the LED driver to not start up due to the difference in V-I characteristic between the resistors and the LEDs. When using Electronic Loads, the CR and CV mode settings are set for when the LED is under stable operation and therefore, is unable to simulate turn on or PWM brightness control characteristics. This may cause the LED driver to function improperly or trigger it’s protection circuits. These testing requirements can be achieved when using a LEDs as a load; however, issues regarding the LED aging as well as different LED drivers may require different types of LEDs or a number of LEDs. This makes it inconvenient for mass production testing.

  • LED Power Driver ATS

    8491 - Chroma ATE Inc.

    1. DC Electronic Load : Chroma 6310A/6330A Series2. Transducer Unit/Module*1 : Chroma A849101/A849102, A849103, A8491043. Time/Noise Analyzer : Chroma 80611 & 80611N card4. Sytem Controller*2 : Industrial PC5. DC Source: Chroma 62000P Series6. Digital Power Meter : Chroma 66200 Series7. OVP/Short Circuit Tester : Chroma 806128. ON/OFF Controller : Chroma 80613*1 : A849101 transfers UUT output signal to voltage signal, and measure by 84911 LED power driver measurement card (200kHz). The optional 80611N Noise card is required for 20MHz ripplecurrent measurement.*2 : The controller includes both 84911 LED Power Driver measurement card and 84903 control card.- 84911: Measure rms current, dimming current/frequency/duty, timing, power & ripple current (200kHz)- 84903 : Provide BL control signal(DC level, PWM, SM bus), and enable ON/OFF signal.C Source : Chroma 6500/61500/61600 Series

  • LED Power Driver Test Solution

    Chroma ATE Inc.

    Capable to test Multi-UUT/Multi-output concurrently that improve productivityoptimized standard test items for LED Power Driver to deliver excellent test performance

  • Advanced SoC Test System

    3680 - Chroma ATE Inc.

    The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.

  • Battery Test System

    Chroma ATE Inc.

    An automated regenerative test system specifically designed for high power battery pack tests. Accurate power sources and measurements ensure test quality suitable for repetitive and reliable testing of crucial battery packs. Applications include incoming inspections capacity validation, production and certification testing.

  • Automatic Battery Test Equipment

    Chroma ATE Inc.

    Chroma specifically developed battery cell test solution which is an integrated solution for battery cell formation & grading processes. From battery cell formation procedure to grouping process, Chroma 17900 series are customized with professional planning service which includes manufacturing flow path planning, test station/ equipment planning, test data management and so on to create high performance manufacturing capability.

  • Automatic Optical Inspection System

    Chroma ATE Inc.

    Adjustable criteria for different process application or modelFlexible algorithms programming editor for mono-crystalline and multi-crystalline silicon solar cellsMultiple interface to communicate with manufacturing equipment or information systemVarious defects inspection capability from multilayer LED lighting designFlexible design that can be easily integrated to your in-line printing system and sorting system

  • Automatic Test System

    Chroma ATE Inc.

    Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.

  • Automatic Transformer Test System / Automatic Component Analyzer

    Chroma ATE Inc.

    The 3250/3252 provide 20Hz-200kHz tes t frequencies, and 3302 provides 20Hz-1MHz test frequencies. In addition to transformer scanning test function, the 3252/3302 have LCR Meter function. In test items, The 3250/3252/3302 cover most of transformer's low-voltage test parameters which include primar y test parameters as Inductance, Leakage Inductance, Turns-Ratio, DC resistance, Impedance, and Capacitance (between windings) etc.; secondary test parameters as Quality Factor and ESR etc.; and pin-short test function. High-speed digital sampling measurement technology combined wi th scanning test fixture (A132501) design, improve low-efficiency transformer inspection to be more accurate and faster.

  • Switching Power Supply ATS

    8000 - Chroma ATE Inc.

    The Chroma Power Supply Automatic Test system Model 8000 is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing. The 8000 test system uses a unique test command optimization technology to prevent repetitive control commands from being sent to the system hardware devices. This improve test speed dramatically and makes the Chroma 8000 an ideal choice for both high speed production applications as well as design verification.

  • Switching Power Supply ATS (SMPS ATS)

    8200 - Chroma ATE Inc.

    Chroma Power Supply Auto Test System model 8200 provides complete solution for PC ATX power supply, adapter and battery charger testing. The application oriented system structure makes it the most cost effective test equipment for initial test in power supply production line. To meet the power supply test requirements, Chroma Power Supply Auto Test System model 8200 has built in 20 ready-made test items. Users can simply enter the test conditions and test the power supply features while proceeding. With the report and management functions, Chroma Power Supply Auto Test System model 8200 is able to provide versatile tools to establish test documents and perform system administration.