Chroma ATE Inc.

Founded in 1984, Chroma ATE Inc. is a world leading supplier of precision test and measurement instrumentation, automated test systems, intelligent manufacturing systems, and test & automation turnkey solutions marketed globally under the brand name "Chroma". Significant markets served by Chroma include semiconductors, photonics, LED, photovoltaics, video & color, flat panel displays, power electronics, passive components, electrical safety, green batteries, electric vehicles, thermoelectrics, automated optical inspection and intelligent manufacturing systems for ICT and cleantech industries.

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  • +886-3-327-9999
  • +886-3-327-8898
  • info@chromaate.com
  • No. 88, Wenmao Rd
    Guishan Dist
    Guishan, Taoyuan 333001
    Taiwan
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Showing results: 91 - 105 of 150 items found.

  • HiPot Calibrator

    Model 9102 - Chroma ATE Inc.

    The 9102 Hipot Calibrators is specially designed standard devices for instrument calibration lab. The 9102 can simulate multiple loads and apply to various Hipot testers. These calibration equipment can save manufacturers a great deal of regular calibration fee.

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  • Hipot Tester

    19070 - Chroma ATE Inc.

    Chroma 19070 series are the smallest Hipot Testers currently available in the world. Its super mini size is easy to carry and the large LCD display is suitable for viewing measurement results. These sophisticated hipot testers are most applicable to safety test for electronic components.

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  • LCM Panel Tester

    27013 - Chroma ATE Inc.

    Chroma 27013 is a portable tester that supports high resolution and large scale LCM with the signals, power supply and test patterns required for LCD module test.

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  • Electrical Safety Test Solutions

    Chroma ATE Inc.

    Hipot Analyzers with 500VA output rating can be used to test and analyze the withstand voltage of high power and leakage current for the products like motor stators and rotors with high parasitic capacitance. Corona detection can be used for turn-to-turn or turn-to-ground test to avoid winding insulation failure from corona discharge.

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  • FPD Tester Model

    27014 - Chroma ATE Inc.

    Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.

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  • Video Pattern Signal Generator

    Model A223800/01/02/03/04 - Chroma ATE Inc.

    Support 8K Super Hi-Vision (7680x4320/8192x4320)Independent graphics core for 8K Super Hi-Vision pattern with less than 200 msec. switch timeUp to 4 signal modules per unitUp to 4 resolution and pattern outputs.7 inch 1024x 600 high-resolution touch panel, GUI interfaceBMP file format supportUSB 3.0 data accessGigabit Ethernet high-speed network interfaceHDMI 2.0a signal module (Optional) - 8K x 4K 60 Hz (4 HDMI port) - 4K x 2K 60 Hz (1 HDMI port) - Pixel rate up to 600MHz (6Gbps TMDS rate) - RGB 4:4:4 / YCbCr 4:4:4 or 4:2:2 or 4:2:0 - HDCP 2.2 / 1.4 - Wide color gamut (ITU-R BT.2020/DCI-P3) - HDR (High Dynamic Range) Testing (HDR infoframe & metadata / EOTF) - SCDC (status & control data channel) Reader

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  • RF ATE Tester

    ADIVIC MP5800/MP5806 - Chroma ATE Inc.

    MP5800 seamlessly upgrades your existing Chroma 3380, 3650 to RF ready ATE test solution, user friendly debug tools, IOT turnkey test solution.

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  • PXI Device Power Supply - 4 Isolated Channels, 20-bit Measurement Resolution

    52310e series - Chroma ATE Inc.

    Chroma 52310e Series i s a programmabl e PXI-Express DPS (Device Power Supply) Card designed for high-accuracy and reliable output power for device test applications. Its compact size, easy level of integration, and high flexibility make the 52310e Series ideal for multi-channel power supplies. Chroma 52310e Series features 8 selectable control bandwidths to ensure high speed output and stable operation; multiple current measurement ranges with a 20-bit DAC/ADC provide the highest resolution and accuracy with a sampling rate up to 600K S/sec; programmable internal series resistance for battery simulation. Chroma 52310e DPS series has a patented hardware sequence engine that has deterministic t iming to cont rol each DPS channel. The sequencer's on-board memory can store up to 1024 sequencer commands and 32k measurement samples per channel.

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  • PXIe Short SMU

    52403P - Chroma ATE Inc.

    Chroma's 52403P is a PXI Express Short Pulse SMU (Source/Measure Unit) designed for fast, precise and reliable sourcing and measurement of thermo-sensitive devices such as high-power laser diodes (LD). Integrating a high-speed pulser, a high precision SMU and a DAQ module into a single PXIe SMU, the 52403P can measure both the LIV and the low-level leakage current of a high-power LDs.

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  • Solar Array Simulator

    62000H-S series - Chroma ATE Inc.

    The latest programmable solar array simulator power supply 62000H-S Series released by Chroma provide simulation of Voc (open circuit voltage) up to 1800V and Isc (short circuit current) up to 30A. The 62000H-S provides an industry leading power density in a small 3U high package. The solar array simulator is highly stable and has a fast transient response design, which are both advantageous to MPPT performance evaluation on PV inverter devices. The 62000H-S Series have many unique advantages including high speed & precision digitizing measurement circuits with a 100kHz A/D, 25kHz D/A controlled I-V curve and a digital filter mechanism. It can simulate an I-V curve accurately and response the mains ripple effect from the PV inverter. In addition, the built-in EN50530/Sandia SAS I-V model in the standalone unit can easily program the Voc, Isc, Vmp, and Imp parameters for I-V curve simulation, without a PC controller.

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  • Regenerative Battery Pack Test System

    17020 - Chroma ATE Inc.

    Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.

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  • Regenerative Battery Pack Test System

    17020E - Chroma ATE Inc.

    Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel

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  • VLSI Test Systems

    Chroma ATE Inc.

    50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P

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  • TO-CAN Package Inspection System

    7925 - Chroma ATE Inc.

    Chroma 7925 is an automatic inspection system for TO-CAN package. The appearance defects over 30 um like lens scratch, partial are clearly conspicuous by using advanced illumination technology. Because the height variation of tray and package exists, Chroma 7925 can calculate the focus distance and compensate to overcome the variation with auto focus function.

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  • VLSI Test System

    3380P - Chroma ATE Inc.

    The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.

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