Showing results: 106 - 120 of 150 items found.
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17020E -
Chroma ATE Inc.
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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58606 -
Chroma ATE Inc.
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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17040E -
Chroma ATE Inc.
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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58625 -
Chroma ATE Inc.
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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7505-K007 -
Chroma ATE Inc.
The Chroma 7505-K007 Thin Film Thickness Automated Optical Metrology System equipped with 3D sensor is suitable for Roll to Roll processing and thin film thickness measurement. The stage embedded with vacuum adsorption function, making soft UUT a flat surface.
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58635 -
Chroma ATE Inc.
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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63110A/ 63113A/63115A -
Chroma ATE Inc.
As shown on the V-I curve in figure 1, the LED has a forward voltage VF and a operating resistance (Rd). When using a resistor as loading, the V-I curve of the resistor is not able to simulate the V-I curve of the LED as shown in blue on figure 1. This may cause the LED driver to not start up due to the difference in V-I characteristic between the resistors and the LEDs. When using Electronic Loads, the CR and CV mode settings are set for when the LED is under stable operation and therefore, is unable to simulate turn on or PWM brightness control characteristics. This may cause the LED driver to function improperly or trigger it’s protection circuits. These testing requirements can be achieved when using a LEDs as a load; however, issues regarding the LED aging as well as different LED drivers may require different types of LEDs or a number of LEDs. This makes it inconvenient for mass production testing.
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61800 series -
Chroma ATE Inc.
Market demand for Distributed Resource (DR) products such as PV inverters and wind energy systems is steadily growing as the world strives for clean renewable energy sources. This demand has created a need for rigorous regulation testing to standards such IEEE 1547 / IEC 61000-3-15 / IEC 62116 ensuring proper and safe operation of on-grid products. It has become critical to manufacturers to conduct these tests to prove compliance and to relieve product liability concerns. Chroma’s new 61800 family of Grid Simulators has been designed to fulfill these test requirements by providing a full 4 quadrant, fully regenerative, grid simulator with advanced features for compliance, safety and product verification testing.
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Chroma ATE Inc.
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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67394 -
Chroma ATE Inc.
The 67394 Multi-Channel Power Module is a new generation of compact, stable and high reliability AC to DC power supply that can test the small size panels. It has multiple power sources with voltage/timing adjustable functions, protection functions and measurement circuits. Its modular design can work with FPD tester and PG card to provide standard power source for testing the panels.
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7505-01 -
Chroma ATE Inc.
Chroma 7505-01 is the newest multi-function optical inspection system that equips with the capability of measuring 1D, 2D and 3D at the same time. Penetrating reflection measurement is used for 1D film thickness measurement to measure the non-destructive film thickness on transparent and translucent material.
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7505-05 -
Chroma ATE Inc.
Recent advancement in optical inspection technology continues to find its path into a variety of market applications. Innovative automated optical testing has become essential and indispensable in areas such as effective dimensional measurement to ensure product manufacturability and process control.
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7661-K003 -
Chroma ATE Inc.
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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61800 Series -
Chroma ATE Inc.
The increased demand for Distributed Energy Resource (DR) products such as PV Inverter and Wind Energy systems, have increased the demand for regulation test standards to insure proper operation and safety of on-grid products. Manufacturers testing to prove compliance, need test equipment that can simulate and measure and test their products. Chroma’s 61800 family of Regenerative Grid Simulators provide a full 4 quadrant, regenerative, grid simulation for compliance, safety, and product verification testing
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58602 -
Chroma ATE Inc.
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.