McBain Systems
Our company has been the leading provider of microscope sales and service to customers in California since 1965. We’ve been working with customers all over the USA and worldwide for decades now. We pay attention to every aspect of our work.
- (805) 581-6800
- (805) 581-6801
- sales@mcbainsystems.com
- 810 Lawrence Drive
Unit 102
Thousand Oaks, CA 91320
United States
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Products
Applications
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product
200mm and 300mm Defect Detection and Review Systems
DDR200 and DDR300
The McBain DDR200 and DDR300 for 200mm and 300mm wafer defect detection and review are unmatched in value and features in this special application and price category. The systems offer significant and unique advantages for both production and engineering use, and provide an ideal solution when both defect detection and dimensional metrology are required. They can be used as dedicated production tools or as versatile process development tools.
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Inspection And Measuring Microscope
McBain ZIII Micro Inspection System
The McBain ZIII Micro Inspection System is the industry standard for CD measurements and inspection, pre/post dicing inspection, pre/post probing inspection, mask inspection, image stitching and critical particle counting.
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Semi-automatic Measuring And Alignment System
McBain Z-NIR Near Infrared Inspection Microscope
The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
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Near Infrared Subsurface Defect Detection and Review Systems
DDR200/300 NIR
The McBain DDR200 NIR (for 200mm) and DDR300 NIR (for 300mm) provide high-speed defect detection and precision measurement on wafers and other parts. These cost-efficient systems offer unique advantages for both production and process development use, providing an optimum near-infrared (900-1700nm) solution when both subsurface defect detection and dimensional metrology are required.
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Wafer Handling Systems for Microscopy
WL150 and WL200
The McBain WL150 and WL200 Series Wafer Handler is a safe, semi-automatic wafer loader designed to use with virtually all major microscopes, optics and inspection devices. It is a portable, economically priced tool which serves as a direct replacement for the Irvine Optical Ultrastation systems. The WL Wafer Handler, available in two configurations to handle 3" to 6" wafers or 4" to 8" wafer sizes, is designed for easy operation, seamless integration, and consistent, reliable handling for labs and automated workstations.
