Flynn Systems Corp.
Incorporated in 1987, Flynn Systems has been providing automated test software solutions for both progammable logic devices and boundary scan. Our tools offer the highest fault coverage, user-friendly interfaces, and affordability.
- 603-598-4444
- 603-598-4111
- info@flynn.com
- 74 Northeastern Boulevard
Nashua, NH 03062
United States
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product
Controllers
onTAP’s THREE TAP CONNECT JTAG
Connect the TAP CONNECT JTAG Controller to your application with either the Xilinx ribbon cable, flying leads, or Altera style adaptors. The onTAP TAP CONNECT Controller automatically senses and adjusts to target I/O voltages and interfaces to devices operating at 1.8 to 5.0 VDC for the standard controller, or 0.99 to 3.6 VDC for the low voltage controller, using the VREF voltage from the target chain. If there is no VREF available, you can set the voltage for the target application from the TAP CONNECT Controller. This facilitates easy configuration to many different JTAG ports, which is helpful in design and manufacturing.
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product
ATG Program
FS-ATG
FS-ATG is the world's easiest ATG program - pull-down menus, online help, and test generation wizard guide new users step-by-step through the process. It takes less than 2 minutes to 'point & click' a setup program for a board full of devices.Generates Vectors Faster Than EverFS-ATG is a 32-bit Windows 98/NT/2000 application that takes full advantage of today's powerful PC's. Small devices finish in seconds and most FPGAs / CPLDs, even the largest and most complex, can develop great tests after in just a few hours.
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product
Boundary Scan Test and JTAG Programming Tool Set
onTAP® Series 4000
onTAP is a comprehensive boundary scan testing and JTAG programming tool set that bolsters the most accurate possible fault coverage in an affordable and expedient manner, while providing support for the entire product life cycle.
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Boundary Scan / JTAG Test Development System
onTAP Development
The onTAP Development system will speed up your project development time and keep costs under control. These tools enable you to quickly and easily develop, run, and debug JTAG tests ranging from single JTAG chain applications to multiple JTAG chain applications with multi-die modules, merged sub-assemblies, and multi-drop configurations.
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onTAP DLL
Whether plugging into a test executive, or running as a plug-in to your own interface, onTAP’s DLL can be linked to and run from third party test executives such as, National Instruments’ LabVIEW™. Flynn Systems provides GUI demo programs written in C++ and C# showing you how to link the onTAP DLL to your test executive
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product
Manufacturing Test Only System
MTO
The MTO restricts access to test development and test files, yet enables users to run any predeveloped onTAP boundary scan / JTAG tests, including memory cluster tests and Flash programming, when activated. The MTO also provides access to ProScan, the graphical debugging environment for onTAP. Users have access to accurate pin-level diagnostics and debug features, such as the netlist browser, test reports, and low-level pin access for toggling pins, to speed up the manufacturing process and ensure accuracy.
