Showing results: 31 - 45 of 65 items found.
-
Teradyne, Inc.
Teradyne’s High-Speed Inline Automated Board Handler with TestStation Multi-Site Test Insert is designed for productivity, fast change-over, and low operating cost. Our in-circuit test solution fits seamlessly into automated production lines to provide “hands-off-lights-out” operation.
-
Teradyne, Inc.
Teradyne test solutions are at the forefront of the 5G test era. Why? We work with the leading semiconductor manufacturers and provide optimized test coverage for the major wireless standards. From emerging millimeter wave devices to the traditional sub-6GHz, our test solutions are already leading the way.
-
Magnum V -
Teradyne, Inc.
Teradyne’s Magnum V systems delivers high throughput and high parallel test efficiency for ultra-high performance FLASH and DRAM memories. Magnum V’s largest configuration delivers up to 20,480 digital channels at 1600Mbps per channel.
-
Magnum VUx -
Teradyne, Inc.
Teradyne’s Magnum VUx system is a flexible, superset test platform for all NAND and MCP products, both cutting edge UFS 3.0, uMCP, and PCIe Gen 4 mobile and automotive devices, as well as SSD NAND ONFI and Toggle, and legacy NAND products such as UFS 2.1, PCIe Gen 3, e.MMC, and eMCP.
-
TestStation LH -
Teradyne, Inc.
The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologies for accurate, reliable, and safe testing of the latest low-voltage technologies.
-
TestStation -
Teradyne, Inc.
Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.
-
Spectrum-9100™ -
Teradyne, Inc.
The Spectrum-9100 is a fully integrated functional test system for factory, depot, and intermediate test applications. It’s the “go to” tester for users needing a mix of digital, analog, mixed-signal, and bus test capabilities across a wide range of products—from legacy boards to advanced systems.
-
UltraFLEX -
Teradyne, Inc.
The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
-
Teradyne, Inc.
Teradyne’s semiconductor test portfolio is transforming the way you test chipsets for automotive, industrial, communications, consumer, smartphones, and computer and electronic game applications. Semiconductor devices span a broad range of functionality, from very simple low-cost devices such as appliance microcontrollers, operational amplifiers or voltage regulators to complex digital signal processors and microprocessors as well as memory devices.
-
Teradyne, Inc.
HSSub is a software-defined family of PXIe Instrumentation that can be integrated and scaled to support digital test applications throughout the product life cycle from design verification to production and sustainment.
-
Di-Series™ -
Teradyne, Inc.
The Di-Series tests all levels of integration from board level (SRA/SRU) to box level (WRA/LRU) units under test (UUTs), while maintaining full compatibility with previous generations of Teradyne instrumentation and systems. Excellent usability and reliability reduce programming and support effort, as well as straightforward upgrades of existing test program sets (TPS).
-
Ai-762 -
Teradyne, Inc.
Ai-762—the newest member of the Ai-760 Series in the Core Systems Instruments (CSi) family—is a standards-based integrated test and measurement tool that consolidates traditional instruments into a single-slot VXI package.
-
IP750Ex-HD Family -
Teradyne, Inc.
The IP750EX-HD has been the test platform that has enabled the industry to manufacture high quality CCD and CMOS image sensors, and it is the most economical platform to meet the needs of newer technologies such as Time of Flight (ToF) sensors. When you use a smartphone, high performance digital still camera, or in-home security and surveillance system, these applications have image sensors most likely tested by Teradyne’s IP750ExHD.
-
Teradyne, Inc.
TestStation Multi-Site Inline is the most productive, lowest cost in-circuit test solution. This "zero-footprint" inline test system provides true 2x-4x parallel test, delivering 200% to 400% greater productivity, and 40% to 50% lower total cost of test.
-
Teradyne, Inc.
Automated versions of Teradyne’s TestStation systems are designed for short takt time automated lines. The TestStation Automated Inline Handler, coupled with a TestStation Test Insert forms a combined integrated solution for any mix, any volume PCBA manufacturing.