Frontier Semiconductor, Inc,
Frontier Semiconductor, Inc, (FSM), offers a range of advanced metrology products and solutions for semiconductor and MEMS applications, including measurement systems for film stress, wafer bow, local stress & strain in Si, SiGe and SOI using Raman Spectroscopy characterization techniques for new films, such as Thermal Desorption Spectroscopy, Quantitative Adhesion Testers, Ultra-thin Wafer Substrate
- +1 408 432 8838
- +1 408 232 1115
- FSM100@frontiersemi.com
- 2127 Ringwood Avenue,
San Jose, CA 95131
United States
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