CSE Co.,Ltd
We pursue customer satisfaction. As you know, the Wafer Probing Machine is to test electric characteristics of each chip created on a wafer. The test is made by a probe of the probe card, attached to a wafer prober and connected to a tester, contacting to a pad of each chip of a wafer on the stage of the wafer prober. In testing this way, chips are sorted into either good or defective chips.
- +82-31- 765-3060
- +82-31- 765-3063
- brian@proberworld.com
- 121-9 Maejari-gil
Gwangju Si, Gyeonggi-do 464-893
Korea, South
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product
Standard Resistance Kit
* Resistor Calibration Substrate * Mili Ohm ~ Giga Ohm * Wafer type size 6, 8, 12 inch.
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product
Probe Cards
Vertical Probe Card. (Mobile D-RAM, L.D.I Flip Chip 60um Pitch,. System LSI, Soc Devices). Cantilever Probe Card. Low Leakage Probe Card.
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product
Wafer Probing Machine
UF3000EX-e
Wafer Probe Station is used in connection with test system in Wafer Test process.It is a device to move wafer automatically to examine fair quality of individual chip on the wafer. Probe Station is seperated depending on purpose. For analysis, for mass production as well as manual, semi-automatic, full-automatic.
