MICRONICS JAPAN CO.LTD.
Micronics Japan Co., Ltd. ( MJC ) was founded in 1970 to provide maintenance services for electronic measuring equipment. In 1973, we developed and marketed peripheral products for the semiconductor industry. Our first probe card was released into the Japanese market in 1976. Our Manual Prober #1 was completed in 1977. The first LCD Prober was marketed in 1985 by MJC. Today, we are proud to keep the leading company position to provide various probing solutions for the Semiconductor and LCD industries.
- +82-32-671-3103
- +82-32-671-3104
- sales@mjcelectronics.com
- 68, Samjak-ro 143-gil, Ojeong-gu, Bucheon-si,
Gyeonggi-do
Republic of Korea, 421-806,
Korea, South
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Wafer Probers
Full Automatic Wafer Prober. Semi Automatic Wafer Prober. High Current Probe Block. 6-inch Manual Prober. 8-inch Manual Prober. 12-inch Manual Prober.
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product
Probe Cards
U-Probe for Multi-die Test of Memory IC. Vertical-Probe Needle Type Probe card suitable for multi-die test of devices with peripheral pads. ertical-Probe Spring Type. Probe card suitable for area array pad test. 64DUTs Multi-Die. Probe Card for RF devices. Fine Pitch.
