Showing results: 1 - 9 of 9 items found.
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HS-930 -
Toray Engineering Co., Ltd.
By adopting our original optical technology, we achieve an inspection speed of about 30% up (compared to HS-830). Improved the front / back judging ability to thin substrates.
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Toray Engineering Co., Ltd.
Quality management for semiconductor manufacturing processes and liquid crystal panel manufacturing processes, which require nano-order precision. Oxygen analyzers used in firing furnaces and N2 reflow ovens.Water quality meters used to monitor the water quality of plant discharge and the pure water used in semiconductor manufacturing processes.Our measuring and analysis equipment is used in a wide range of fields.
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SP series -
Toray Engineering Co., Ltd.
SP series, high accuracy 3D surface profiler measurement system with white light interferometry.
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NM Series -
Toray Engineering Co., Ltd.
Detecting failures and uneven points on color resist film coated by Toray’s Coater. Toray’s customized algorithm achieved fast throughput and high resolution.
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GEN3000T -
Toray Engineering Co., Ltd.
GEN3000T is an inspection system that performs automatic inspection of individual semiconductor chips.This revolutionary chip surface inspection system was achieved by combining the chip handling technology cultivated by Toray with the inspection algorithm used in the "INSPECTRA®" wafer defect inspection system.
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RV-3000 -
Toray Engineering Co., Ltd.
Reduces surface inspection device review time and contributes to greater inspection efficiency! This system uses address information for defects detected by surface inspection equipment to acquire images of defects with a high level of magnification, and categorizes defect types.
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INSPECTRA® Series -
Toray Engineering Co., Ltd.
INSPECTRA® series meet the requests of 100% automatic inspection with high speed and high specifications from front-end to back-end of semiconductor processing. INSPECTRA® series are wafer inspection systems with high speed and high sensitivity. Our original "Die-to-Statistical-Image" comparison method achieves the target defects detection controlling process variation and overkill.
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INSPECTRA® IR Series -
Toray Engineering Co., Ltd.
An infrared internal defect inspection system has been added to the INSPECTRA® series.It is now possible to inspection with both infrared and visual light in one system.
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INSPECTRA® PL Series -
Toray Engineering Co., Ltd.
This system uses luminescent images created using photoluminescence (PL) to perform high-speed, high-sensitivity automatic inspection for crystal defects, cracks, and luminescence defects which cannot be detected with conventional visible light surface inspection!
