Showing results: 106 - 120 of 176 items found.
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GX3788 -
Marvin Test Solutions, Inc.
The GX3788 is a user configurable, FPGA-based, 3U PXI multi-function card which supports digital and analog test capabilities. The card employs the Altera Stratix III FPGA which features over 45,000 logic elements and 1.836 Kb of memory. The GX3788 is based on the GX3700 FPGA card and includes an integral daughter board which provides (8) differential input, 16-bit, 250 MS/s A to D converters and (8), 16-bit, 1 MS/s, D to A converters. The module's FPGA is pre-programmed, providing access to all digital and analog functions. Alternatively, users can program or modify the FPGA , allowing user to adapt the module to their own specific test needs. The design of the FPGA is done by using Altera's free Quartus II Web Edition tool set. Once the user has compiled the FPGA design, the configuration file can be loaded into the FPGA directly or via an on-board EEPROM.
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GX6062 -
Marvin Test Solutions, Inc.
The GX6062 is a high-density 6U PXI RF switching card that provides 200MHz bandwidth and multiple switching configurations. The GX6062 has 12 groups of 1 x 4 differential, non-terminated RF multiplexers. The 12 groups can be used to create multiple configurations including: 6 x 1:9, 3 x 1:19, 2 x 1:29, 1 x 1:59, and more. The GX6062 switching card plugs directly into any 6U PXI chassis.
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GX3348 Series -
Marvin Test Solutions, Inc.
The GX3348 is a multi-channel analog I/O 6U PXI card which provides (3) programmable sources, a ground source connection, a pulse / square wave generator (A version only) and a 4 x 48 or 4 x 64 matrix - allowing the user to route the 3 sources, or ground to any of the 48 or 64 I/O channels. In addition, each I/O channel can be connected to a 16-bit A to D converter, providing DC voltage measurement capability for each channel. The module also offers (8) static digital I/O for controlling / monitoring a UUT's digital signals.
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GX3500 -
Marvin Test Solutions, Inc.
The GX3500 is a user configurable 3U FPGA PXI card which offers 160 digital I/O signals for specific application needs, as well as providing pin for pin compatibility with NI PXI 7811R and 7813R FPGA cards. The card employs the Altera Cyclone III FPGA which can support clock rates up to 150 MHz and features over 55,000 logic elements and 2.34 Mb of memory.
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TS-201B -
Marvin Test Solutions, Inc.
The TS-201 is a state-of-the-art I-Level and Depot level test set for MIL-STD-1760 and legacy armament systems including launchers and bomb racks.
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GX1110 -
Marvin Test Solutions, Inc.
The GX1110 is a high performance, single-channel PXI arbitrary waveform generator that offers function generator and arbitrary waveform generator functionality within one instrument. Built-in waveforms are available for use with both the DDS or AWG modes of operation and include Sine, Triangle, Ramp, Noise, Gaussian pulse and Sinx / x. A flexible sequencer is also available as part of the AWG's architecture, supporting the generation of complex waveforms.
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GX6384 -
Marvin Test Solutions, Inc.
The GX6384 3U PXI multiplexer switch card provides users with the ability to switch and interface tester resources to multiple UUT connections. The card is available in three different configurations, supporting 32 x 2, 32 x 4, and 32 x6 switch configurations.
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GX1200/GX1201 -
Marvin Test Solutions, Inc.
The GX1200 and GX1201 are high performance, single-channel PXI arbitrary waveform generators that combine a function generator, arbitrary waveform synthesizer, programmable sequencer, pulse generator, and modulation generator in one instrument. The GX1200 Series delivers all this at a lower cost than comparable benchtop or VXI-based instruments.
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GX6021 -
Marvin Test Solutions, Inc.
The GX6021 is a high-density 3U PXI switching card that provides 200 MHz bandwidth and offers four groups of 1x4 multiplexer scanners.
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GX2482 -
Marvin Test Solutions, Inc.
The GX2482 series are a high performance, dual differential channel, 16-bit digitizer offering high dynamic range and excellent SFDR. The module’s differential inputs, coupled with its low distortion makes it an ideal instrument for analyzing high performance or low level analog signals. Each channel offers 3 selectable low pass filters, a 16 bit, 180 MS/s ADC, and 64 M words of memory for each channel.
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DIOEasy -
Marvin Test Solutions, Inc.
DIOEasy offers test engineers an efficient tool for developing, debugging, and executing digital test vectors for Marvin Test Solutions' GX5050 series, GX5150 series, GX5280 series and GX5291, GX5292, GX5293 and GX5295 dynamic digital instruments.Digital I/O (DIO) systems are very complex and typically require a substantial amount of programming effort to define data vectors. In order to simplify vector development, Marvin Test Solutions developed Windows-based DIOEasy, providing users with an easy to use interface. Toolbars and menus provide quick access to vector editing and viewing tools.
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ICEasy Test Suite -
Marvin Test Solutions, Inc.
Marvin Test Solutions' ICEasy Test Suite is supplied with both the TS-900 and TS-960 semiconductor test platforms and provides a comprehensive set of software tools - facilitating the development and debugging of test programs for semiconductor devices. In addition the suite includes I-V curve and Shmoo plot tools for analyzing a device's DC and AC characteristics. The complete suite of tools interfaces seemlessly with Marvin Test Solutions' ATEasy®, a test executive and test development evironment which is supplied with each TS-900 / TS-960 system.
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DIOEasy-FIT -
Marvin Test Solutions, Inc.
Marvin Test Solutions' DIOEasy-FIT option offers test engineers a software tool set for importing and converting STIL, WGL, VDC/EVCD files to a Marvin Test Solutions' digital instrument file format. DIOEasy-FIT works in conjunction with Marvin Test Solutions' DIOEasy waveform display and editor software which provides an efficient tool set for developing, debugging, and executing digital test vectors for all MTS dynamic digital instruments.
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TS-217 -
Marvin Test Solutions, Inc.
The TS-217 is an I-level and Depot-level Universal Launcher test set supporting fighter aircraft launchers including the LAU-127, LAU-128, and LAU-129 (AMRAAM), LAU-117 and LAU-88 (Maverick), and LAU-7 (Sidewinder) missile launchers, launcher electronic assemblies, launcher power supplies, and circuit cards. The TS-217 is also used as a depot-level tester for F-18 armament including launchers (LAU-127, LAU-7, LAU-115, and LAU-116), bomb racks (BRU-32), and aircraft pylons (SUU-62 and SUU-63). Additionally, the TS-217 supports MAU-169 Paveway kits, subassemblies, and circuit cards. The TS-217 performs full parametric functional testing as well as troubleshooting to the faulty LRU (I-Level configuration) and SRU (Depot-Level configuration). The TS-217 can be used as an I-Level tester or as a Depot / Acceptance tester for launcher subassemblies.
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GX3700 -
Marvin Test Solutions, Inc.
The GX3700 is a user configurable, FPGA-based, 3U PXI card which offers 160 digital I/O signals which can be configured for single-ended or differential interfaces. The card employs the Altera Stratix III FPGA, which can support SerDes data rates up to 1.2 Gb/s, digital I/O clock rates of 700 MHz, and features 47,500 logic elements and 2.1 kb of memory. The GX3700 is supplied with an integral expansion board providing access to the FPGA’s 160 I/Os. Alternatively, users can design their own custom expansion cards for specific applications - eliminating the need for additional external boards which are cumbersome and physically difficult to integrate into a test system. The design of the FPGA is done by using Altera’s free Quartus II Web Edition tool set. Once the user has compiled the FPGA design, the configuration file can be loaded into the FPGA directly or via an on-board EEPROM.