Advantest Corp.
Automated Testing Equipment (ATE) verify the quality, performance and reliability of semiconductors by electrically testing these complex and multifarious functions of semiconductors with high accuracy. The automated testing technologies from Advantest at the top of the industry are contributing to higher efficiency in production on customer sites, technological innovations of the electronics industry, and greater safety, security and comfort for society.
- +81-3-3214-7500
- +81-3-3214-7712
- webmaster@advantest.com
- Shin Marunouchi Center Bldg.
1-6-2, Marunouchi, Chiyoda-ku,
Tokyo, 100-0005
Japan
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product
Change Kit
This custom-designed, swappable tool (change kit), which is part of the handler, is for the customer whose devices come in an array of shapes and sizes. It allows a handler to be used flexibly with a variety of devices, instead of having to be dedicated to one specific device type.
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Hadatomo™ (Photoacoustic Microscope)
WEL5200
The HadatomoTM Ζ simultaneously images the oxygen saturation of blood vessels with two wavelengths of optical ultrasound, and images the skin texture, pores, and skin structures such as sebaceous glands with ultrasound.
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Hadatomo™ (Photoacoustic Microscope)
WEL5100
Evaluations of treatments for blood circulation disorders, as well as regenerative medicine therapies, currently rely on biopsies and animal experiments, but these methods have well-noted shortcomings. Advantest's new Hadatomo™ photoacoustic microscope addresses these drawbacks, offering researchers an unprecedented non-invasive process for analyzing blood vessels within the dermis. Utilizing a new imaging method that combines optical technology and ultrasound, the Hadatomo™ provides high-contrast images of blood vessels without the use of contrast agents. This new imaging technology is poised to contribute to further advances in regenerative medicine, dermatology, and plastic surgery.
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MASK MVM-SEM® E3600 Series
E3630
Together with the miniaturization of semiconductors, high-accurate and stable measurement and evaluation is needed for circuit patterns such as mask patterns and holes. Advantest's E3600 series are used by a wide variety of companies, from semiconductor manufacturers to photomask makers to device and materials producers.
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MASK MVM-SEM® E3600 Series
E3640
Ongoing semiconductor process shrinks are driving new demand for stable, highly precise measurement of pattern dimensions for photomask and wafer production. The E3640 satisfies these requirements with industry-leading precision measurement capabilities and upgraded functionality that enhances mask R&D and production efficiency.
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MASK MVM-SEM® E3600 Series
E3650
Amid the progress of multiple-exposure technology, and the development of finer-pitch and more complicated circuits, as well as increases in the number of masks and the number of measurement points on each mask, the size of wiring patterns formed on photomasks needs to be measured and evaluated stably with high precision. Advantest’s E3600 series meets the needs of state-of-the-art devices with high measurement repeatability and stable throughput.
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Memory Test System
T5511
Offering Multi-functionality and Industry's Top Test Speed of 8Gbps.
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SSD Test Dystems
MPT3000HES / MPT3000HES2
Compact, highly efficient SSD test solution allows customers to accelerate time to qualification for their new designs and time to market for their latest storage products.
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Stimulus Test Cell
HA7300
The Stimulus Test Cell HA7300 is a test cell which provides an environment for high-speed, highly accurate temperature and pressure test of differential pressure sensors, utilizing Advantest’s unique temperature control unit with simultaneous temperature control for 8 devices, as well as a newly developed 2Port pressure controller and pressure application nozzle.
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Stimulus Test Cell
HA7200
The HA7200 enables these improvements by providing high-speed, high-accuracy temperature and pressure test for automotive sensor R&D and production. Advantest’s proprietary temperature control technology delivers an optimized test solution for high-spec pressure sensors across a broad range of temperatures, in the automotive industry and beyond.
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Test Handler
M4872
Improve Efficiency in High-Volume Manufacturing and Device Characterization.
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Test Handler
M4171
Advantest’s M4171 single-site handler combines these capabilities in a portable design that is ideally suited for use in engineering environments.
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Test Handler
M6242
Optimal Test Handler for Mass-Production DRAM, with Double the Throughput.
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Burn-In Test System
ATS 5030
Transform your burn-in testing strategy with the ATS 5030 Burn-in Test (BiT) Platform. This next-generation semiconductor tester offers independent per-site burn-in for semiconductor packaged devices. Deployed globally, the ATS 5030 BiT Platform is a turnkey system that consistently delivers industry-leading thermal stress test for billions of semiconductor devices.
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Custom SLT And Burn-in Test Solutions
One-size-fits-all test equipment not meeting your needs? Engineering team out of bandwidth? Talk to us. We'll solve your toughest semiconductor test challenges with innovative, elegant test solutions. Our team works with yours to create new test solutions to not only fit your specs, but also to achieve your business goals of reducing testing costs, improving yields, and streamlining your testing process.
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W2BI Inc.
W2BI envisages an optimized user experience of seamless communication between an array of wireless devices defined by adaptability, inclusivity and independence. We envision W2BI as being the global forerunner in shaping this interoperability within the automated wireless industry. A member of the Advantest Group
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Cloud Testing Service, Inc.
CloudTesting™ Service leverages recent advances in cloud computing that have transformed the concept of ownership from physical possession of an asset to a licensing agreement, with the asset itself residing in the cloud. Applying this paradigm to semiconductor test, we built a business model that expands customer access to testers by delivering test IP directly to their personal computers.
