Corelis, Inc.

JTAG/boundary-scan technology, standardized under IEEE-1149.1 and updated and expanded by a suite of related standards, has become the method of choice for testing and designing reliable, high-technology, electronic products. Design-for-testability (DFT) practices have enabled new, innovative JTAG applications from debug and test to in-system programming, the technology continues to improve and expand into new areas. Corelis is a pioneer in the rapid development of innovative IEEE-1149.x-compliant products and services in support of the JTAG/boundary-scan market. As a result of our ingenuity and contributions to the industry, a growing number of customers have been able to incorporate boundary-scan technology into their product development processes in order to gain a competitive edge in today’s marketplace.

  • 562-926-6727
  • 562-404-6196
  • support@corelis.com
  • sales@corelis.com
  • 13100 Alondra Blvd.
    Cerritos, CA 90703
    United States

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Showing results: 31 - 45 of 57 items found.

  • JTAG Boundary-Scan Controllers for High-Volume Production Systems

    Corelis, Inc.

    Corelis has designed special hardware that autonomously performs concurrent (gang) testing and programming of multiple units without additional user intervention. The entire testing and programming, including on-the-fly verification of results, is done in modular and expandable hardware.

  • Test Program Execution for High-Volume Production Systems

    ScanExpress Runner Gang - Corelis, Inc.

    Electronic manufacturing test systems must be fast and efficient. Schedules today are shorter, products are more complex, and the market demands higher speed—the product needs to be built and shipped yesterday.ScanExpress Runner Gang Edition is a concurrent boundary-scan and in-system programming test executive designed specifically for high volume production. Unlike traditional test systems which execute sequentially on a single unit under test (UUT) at a time, ScanExpress Runner Gang Edition provides concurrent (gang) testing on up to 8 UUTs for improved test and programming times.

  • Boundary-Scan Test Coverage Analysis Tool

    ScanExpress DFT Analyzer - Corelis, Inc.

    Test coverage statistics provide engineers and managers valuable information to make critical decisions in product development and manufacturing.ScanExpress DFT Analyzer is an automatic test coverage analysis tool for printed circuit boards and systems that include a mix of boundary-scan and non-boundary-scan devices. The tool assists design and test engineers to increase fault coverage and reduce boundary-scan test procedure development times. Using ScanExpress DFT Analyzer results in better informed test decisions.

  • Boundary-Scan Test Executive

    ScanExpress Runner - Corelis, Inc.

    Efficiency in engineering means managing your most precious resources: time and effort. Automated testing is essential and boundary-scan is a critical component; no other structural test system provides the same value.When down to the wire, your boundary-scan test system needs to be built both for ease-of-use and reliability; a robust and powerful mechanism to ensure that no matter the state of production, all boundary-scan tests can be quickly and faithfully executed to maintain forward momentum.

  • Design for Testability (DFT Test)

    Corelis, Inc.

    Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.

  • Flash Memory In-System Programming File Generation

    ScanExpress Flash Generator - Corelis, Inc.

    ScanExpress Flash Generator is a tool to quickly create Flash programming files for use with ScanExpress™ software. The application operates as a standalone utility or integrates into ScanExpress TPG for creation and reuse of boundary-scan test files for in-system programming (ISP).ScanExpress Flash Generator combines a board Netlist, scan chain description, and BSDL files to automatically create Flash Programming Information (FPI) files. These files include all information necessary for ScanExpress Runner™ or ScanExpress Programmer™ execution systems to perform read, write, erase, and verify operations—in-system using high performance Corelis hardware.

  • Universal In-System Programming Tool

    ScanExpress JTAG Programmer - Corelis, Inc.

    ScanExpress JTAG Programmer is a universal in-system programming (ISP) solution designed for convenience and versatility—a modular, multi-functional, and high-performance tool to program, read, and verify Flash memories, serial EEPROMs, CPLDS, FPGAs, and more.Like all Corelis ScanExpress family products, ScanExpress Programmer is a tool for all phases of the product life cycle—whether programming early code during product development, programming production code during manufacturing, or reprogramming units out in the field, ScanExpress Programmer is designed to fit all in-system-programming needs.

  • System-Level Interconnect Solution For ScanExpress Boundary-Scan Tools

    ScanExpress Merge - Corelis, Inc.

    Combine Multiple Assembly Test Files Corelis ScanExpress Merge, a member of the ScanExpress suite of boundaryscan test tools, is a software application designed to import and join test files for multiple independent assemblies and assist in configuration of a combined test procedure.Using completed ScanExpress TPG test files and module interconnection data, ScanExpress Merge quickly combines combined test plan files for system testing with minimal user effort.

  • Advanced Diagnostics for ScanExpress™ JET JTAG Embedded Test Solutions

    ScanExpress JET Advanced Solutions - Corelis, Inc.

    ScanExpress JET advanced diagnostics add additional diagnostic resolution with fully automated analysis translating functional test results to down to the net and pin level, even with BGA packages.The seamless integration with ScanExpress JET and ScanExpress Runner as well as the ability to output ScanExpress Viewer fault reports for PCB visualization make ScanExpress JET Advanced Diagnostics a must-have tool for any JTAG test system.

  • Visual Fault Diagnostics and Repair System

    ScanExpress Viewer - Corelis, Inc.

    ScanExpress Viewer™ is a printed circuit board (PCB) CAD data & photograph visualization tool for boundary-scan test development, electronic manufacturing test, and product repair environments.When combined with ScanExpress ADO™ (Advanced Diagnostics Option) for detailed results from ScanExpress Runner™, ScanExpress Viewer displays fault coordinates and connected traces superimposed directly on a board photograph or CAD layout diagram for expedient repair.

  • Boundary-Scan Advanced Diagnostics Option for ScanExpress Runner

    ScanExpress ADO - Corelis, Inc.

    Being able to quickly pin point faults can provide the difference between a long night at the office or spending time at home with the family.ScanExpress ADO is designed to take diagnostic guesswork out of the equation. The fully automated analysis option quickly parses test vectors and identifies faults down to the net and pin level.

  • Semiconductor Authenticity Verification & Anti-Counterfeiting

    JTAG Interrogator - Corelis, Inc.

    Top manufacturers have used JTAG tests for years to ensure electronic systems are free from defects and assembled correctly. With growing uncertainty in supply chains and the proliferation of counterfeit components, that same technology can be used to verify the authenticity of system components.The Corelis JTAG Interrogator is an affordable solution for semiconductor verification. The software and hardware system provides the means to quickly identify components on an assembled electronic product by reading available information from the JTAG chain. Components can also be scanned to discover undocumented opcodes that may indicate hidden JTAG capabilities such as backdoors and harmful or malicious functions.Fast and nonintrusive JTAG component identification has never been so easy.

  • Boundary-Scan Interactive Analyzer & Toolkit

    ScanExpress JTAG Debugger - Corelis, Inc.

    Test probe access is a luxury—modern electronic system design techniques such as blind and buried vias or ball-grid-array (BGA) devices guarantee limited signal access. Test points quickly reduce precious board real-estate and can even degrade performance. ScanExpress JTAG Debugger overcomes these limitations to provide the control and visibility necessary to quickly debug and test hardware, using a simple JTAG port to interface with IEEE-1149.1 compliant devices.Whether debugging prototype hardware, enhancing production tests with boundary-scan control, or diagnosing a faulty board in the field, ScanExpress Debugger’s easy-to-use and versatile interface helps engineers test and debug systems faster and more efficiently.

  • Bus Analyzers & Exercisers

    Corelis, Inc.

    Corelis offers several bus analyzer products to satisfy different technical needs and price points. Corelis bus analyzers and exercisers offer analysis, test, debug, and validation capabilities for product development, system integration, and manufacturing of digital boards and systems. All of our bus analyzers are PC-based and come with software that runs on Microsoft Windows 7, Windows 8/8.1 and Windows 10.

  • JTAG Emulator for BAE Systems RAD750 Microprocessors

    CodeRunner JTAG Emulator - Corelis, Inc.

    Designed for the most hazardous high radiation environments, the BAE Systems RAD750 radiation hardened PowerPC microprocessor is the most advanced processor offered to the space community. From the Mars Reconnaissance Orbiter to the Curiosity Rover, the RAD750 microprocessor has proven time and again to lead the industry in quality, performance, and cost.

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