Showing results: 106 - 110 of 110 items found.
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BCM91125E -
Broadcom Limited
The BCM91125E is a full-length PCI evaluation board with the SiByte® BCM1125H MIPS processor System on a Chip (SoC). The board is designed for software development and developing PCI applications, which require high-performance processors. The BCM91125E can be plugged into a PCI slot in any PC, workstation or server, or can be used as a stand-alone device.
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SAS3808 -
Broadcom Limited
Broadcom Tri-Mode SerDes technology enables seamless operation of PCIe, SAS or SATA storage devices in a single drive bay. The introduction of PCIe devices executing NVMe to the existing SAS/SATA infrastructure makes industry standard, hot-pluggable drive bays even more versatile. Whether you’re building external or cloud-based storage systems for high connectivity, or outfitting servers, the SAS3808, 8-port, 12Gb/s Tri-Mode SAS/SATA/PCIe Gen 4.0 IOC provides choices for storage optimization by enhancing direct-attached storage (DAS) solutions.
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PEX 8614 -
Broadcom Limited
The ExpressLane™ PEX 8614 device offers 12 PCI Express Gen 2 (5.0 GT/s) lanes, capable of configuring up to 12 flexible ports. The switch conforms to the PCI Express Base Specification, rev 2.0. The PEX 8614 architecture supports packet cut-thru with the industry's lowest latency of 140ns (x4 to x1) and offers two virtual channels for traffic prioritization in the system.
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PEX 8680 -
Broadcom Limited
The ExpressLane™ PEX 8680 device is the industry's first PCIe switch to offer 80 PCI Express Gen 2 (5.0 GT/s) lanes, capable of configuring up to 20 flexible ports. The switch conforms to the PCI Express Base Specification, rev 2.0. The 80-lane switch enables users to add scalable, high bandwidth, non-blocking interconnection to a wide variety of applications including servers, communications, storage, blade servers, and embedded systems.
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Broadcom Limited
With Mainframe Testing and Quality solutions from CA Technologies, DevOps teams can quickly setup testing environments for mainframe applications with critical dependent components and test data.