PacketMicro Inc.
PacketMicro, based in Silicon Valley, provides a wide range of gigahertz probes, probe positioners, bench-top probe stations, and digital microscopes. In addition, PacketMicro offers wireless modules and engineering services in Bluetooth Smart, ZigBee, and wireless sensor networks. PacketMicro customers include many Fortune 100 companies.
- (408) 675 3900
- 1 408 580 0059
- info@packetmicro.com
- 1900 Wyatt Drive,
Suite 9
,Santa Clara, CA 95054
United States
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Microscopes
A digital or traditional optical microscope can help engineers check on their high-speed probing activities much more easily. It will assure the probe tips will touch on the right contact(s), with correct contact angle and right amount of force. We use both digital and optical microscopes in our own lab. The information in this page is to help you choose a microscope best suits you.
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Microwave Probes
D-Probe
With only two signal pins, D-Probes can perform accurate measurements without the need of nearby ground pads.
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PCB Holders
PacketMicro offers a family of horizontal and vertical PCB holders for engineers to hold PCB in a desired orientation for steady and easy probing.
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Probe Positioners (Probe Manipulators)
PacketMicro offers a broad ranges of probe positioners to allow designers to guide standard oscilloscope/TDR/RF/microwave probes onto the small geometries of fine-pitch interconnects, SMD packages, MCMs, hybrids and ICs.
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Probe Systems
These flexible probe stations are designed for the ever-changing test configurations required in a engineering lab. Combined with durable probes or your own high-speed probes, PacketMicro probe stations are the most cost-effective probing solutions in the industry.
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Substrates
This substrate allows engineers toperform probe-tip calibration and move the measurement reference point to the probe tips.
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Microwave Probes
S-Probe
S-Probe series of single-ended probes can perform up to 20 GHz are designed for RF, power integrity, and signal integrity testing. Its strong beryllium copper (BeCu) tips is perfect for direct probing of uneven surfaces, such as solder pads and circuit components. This is a big improvement over the fragile microprobes.
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TDR Probe
TDP Blade Probe
The TDP Blade Probe enables fast and convenient TDR measurements and debugging. The BladeProbe tips are made from strong and rigid beryllium copper blades for handheld and probe station probing. The passive probe can be used to measure impedance, clock jitters, and skews. The TDP BladeProbe series can be connected to TDR, high performance scopes, and vector network analyzers.