Hprobe Company
Hprobe offers a 3D magnetic field wafer tester for all types of magnetic devices : - Planar and perpendicular Magnetic Tunnel Junction (MTJ) - STT-MRAM - SOT-MRAM - TMR sensors - Magnetic MEMS sensors Hprobe has developed a unique patented technology of multidimensional magnetic field generator for magnetic devices and sensors wafer level characterization and testing. With our 3D generator technology, each magnetic field spatial axis is driven independently. User can apply and control the maetic field in any direction of space, as well as generate rotating fields.
- +33 476 63 07 52
- 4 Rue Irène Joliot-Curie
EYBENS, 38320
France
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Automated Wafer Prober for Magnetic Devices and Sensors
Hprobe design and fabricate turnkey automated testing equipment (ATE) for electrical characterization and testing of integrated circuits under magnetic field such as MRAM (Magnetic Random Access Memory) and sensors. In each phase of the technology and product development as well as during mass manufacturing, a dedicated magnetic tester is available.
