Datest
Based in Fremont, CA, Datest is an ISO9001- and AS9100-certified provider of advanced, integrated PCBA testing and inspection services, serving the CM/EMS as well as the OEM community since 1984. We offer in-circuit testing (ICT) and test development (hardware and software) for all major ICT platforms (Agilent 3070, GenRad, and Teradyne). We augment ICT with SPEA Flying Probe testing, Agilent 5DX and Dage Ruby 2D X-ray with X-Plane Technology, benchtop boundary scan, and functional testing.
- (+1) 510.490.4600
- (+1) 510.490.4111
- info@datest.com
- 47810 Westinghouse Drive
Fremont,, CA 94539
United States
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product
Functional Testing and Test Engineering
Customer-supplied or developed in-house• Ruggedization of existing (lab-built) fixtures• Co-develop hardware/software• Deployment, implementation, and training• Engineering evaluation tools• Design verification• Medical device evaluation• Manufacturing test systems• Verification test systems• Go/No-go tests• Serialization, recordkeeping, and datalogging• Troubleshooting failed units with other test platforms
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In-Circuit Testing and Test Engineering
5184 Test NodesHPUX or Windows60 Mhz ASRU Frequency Counter, Timer10 Mhz Clock, 6 Mhz data ratesVector Test for VLSI, PLCC & ASICSTestjet and VTEP Vectorless TestingAdvanced Boundary ScanSilicon Nails AvailableSeries V upgradeable
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product
In-Circuit Testing and Test Engineering
Teradyne Z1820
2048 Pure Pin Test Nodes3 & 6-wire Analog MeasurementsVector Test for VLSI, PLCC’s & ASICSMultiscan II Vectorless TestingIEEE Functional Interface BoardLarge Custom Vector Library
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product
In-Circuit Testing and Test Engineering
GenRad 2287
3560 Hybrid Test NodesWindows InterfaceTotal GenRad 227X Migration Capability20 Mhz Clock, Sync, and Trigger, 5 Mhz data ratesVector Test for VLSI, PLCC’s & ASICSTest Express Vectorless TestingMultiple Chain Boundary ScanAnalog Functional Test Module
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product
In-Circuit Testing and Test Engineering
Teradyne Z1890
2048 Pure Pin Test Nodes3 & 6-wire Analog MeasurementsVector Test for VLSI, PLCC’s & ASICSMultiscan II Vectorless TestingIEEE Functional Interface BoardLarge Custom Vector Library
