Kratos Analytical Ltd

For over forty years Kratos Analytical has provided state-of-the-art spectrometers for surface analysis and we continue with development of leading technologies. Now into our fifth decade, Kratos Analytical is committed to service, quality and customer satisfaction, and we believe that this specialist web area will help you find the information you need for your surface analytical applications.

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  • +44 (0) 161 888 4400
  • +44 (0) 161 888 4402
  • Trafford Wharf Road
    Wharfside, Manchester M17 1GP
    United Kingdom
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  • X-Ray Photoelectron Spectrometer

    AXIS Supra - Kratos Analytical Ltd

    AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterisation. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode. XPS spectroscopy and imaging results can be complemented by additional surface analysis techniques such as: ultraviolet photoemission spectroscopy (UPS); Schottky field emission scanning Auger microscopy (SAM) and secondary electron microscopy (SEM) and ion scattering spectroscopy (ISS). The AXIS Supra replaces the AXIS Ultra DLD as Kratos' flagship x-ray photoelectron spectrometer.

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  • Ar Gas Cluster Ion Source

    GCIS - Kratos Analytical Ltd

    The Kratos Ar Gas Cluster Ion Source (GCIS) is optimised for depth profiling organic materials in Arn+ cluster mode and inorganic materials in Ar+ monomer mode, dependent on the operating parameters defined by the user and the type of material to be profiled. In Arn+ ion cluster mode the ions can be accelerated up to a maximum of 20 keV. This enables the successful sputter depth profiling of the widest range of polymer materials to be undertaken. However, Arn+ cluster depth profiling has been shown to give very low sputter yields for inorganic materials. In order to retain the capability of generating depth profiles from this class of materials this ion source can also be operated in the more conventional Ar monomer (Ar+) mode.

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  • Software Encompases Instrument Control

    ESCApe - Kratos Analytical Ltd

    ESCApeTM software encompases instrument control, data acquisition and data processing in a single, easy to use package. This is the latest generation of software for use on MS Windows operating system and replaces the long standing Vision 2 acquisition and processing software.

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