Nikon Metrology, Inc.

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Compact and Low-Weight X-ray System

XT V 130

Nikon Metrology, Inc.

XT V 130 - Nikon Metrology, Inc.

Compact XT V 130 QA-system for affordable X-ray visualization and automated inspection

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Contract Services for X-ray and CT Inspection

Nikon Metrology, Inc.

Nikon Metrology, Inc.

If you are manufacturer of components or assemblies incorporating plastics, metals, ceramics, electronic components or any combination of these, Nikon Metrology has in-house Inspection centers to perform X-ray and CT contract inspection services for new or existing clients.

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Inspection and Measurement of Critical Dimensions

NEXIV VMZ-K6555

Nikon Metrology, Inc.

NEXIV VMZ-K6555 - Nikon Metrology, Inc.

The Nikon Confocal NEXIV VMZ-K6555 was developed on the strength of Nikon's leading opto-mechatronics (optical, mechanical and electronic) technologies. It incorporates a variety of confocal optics for fast and accurate evaluation of fine three-dimensional surface metrology, image processing technology, and TT L laser autofocus. It allows both 2D and height measurements in the same field of view.

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New High-Definition Color Microscope Camera

DS-Fi3

Nikon Metrology, Inc.

DS-Fi3 - Nikon Metrology, Inc.

The DS-Fi3 is equipped with a 5.9 megapixel CMOS image sensor, which enables the capture of high-definition images of up to 2880 x 2048 pixels. With a new CMOS image sensor and high-speed data transfer via USB3.0, the DS-Fi3 enables fast focusing even in high-resolution imaging, and efficient image acquisition when using a wide range of illumination techniques. The DS-Fi3 has significantly higher quantum efficiency and lower readout noise than conventional models. It allows the capture of brighter images with higher S/N ratios in fluorescence observation.

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X-ray and CT Inspection of Larger Samples

XT H 225/320 LC

Nikon Metrology, Inc.

XT H 225/320 LC - Nikon Metrology, Inc.

The XT H 225/320 LC features a more powerful microfocus X-ray source that is able to run highly accurate inspection on dense industrial objects. Nikon Metrology is the only company to produce 320kV microfocus X-ray sources.

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X-ray Inspection of Electronic Components

XT V 130C

Nikon Metrology, Inc.

XT V 130C - Nikon Metrology, Inc.

The XT V 130C is a highly flexible and cost-effective electronics and semiconductor inspection system.

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Ultra-fast High Definition 3D Scanner

ModelMaker H120

Nikon Metrology, Inc.

ModelMaker H120 - Nikon Metrology, Inc.

By combining a frame rate of 450 Hz, a stripe width of 120 mm and a resolution of 35 μm, users benefit from high productivity and detailed measurements with a single sensor. Without relying on interpolation techniques to artificially boost data density, the ModelMaker H120 guarantees fast data collection over a large area without compromising on small details – offering great flexibility in a single solution even when cycle time is critical, no matter the type of parts measured.

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'Absolute-Accuracy' Metrology-CT (MCT) System

MCT225

Nikon Metrology, Inc.

MCT225 - Nikon Metrology, Inc.

This new 'absolute-accuracy' Metrology-CT (MCT) system guarantees that all internal and external geometry is measured efficiently. A proprietary liquid cooled micro-focus reflection source and air-cooled cabinet provide long-term stability and enable the MCT225 to achieve an impressive accuracy specification.

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ACB Inspection system

XT V 160

Nikon Metrology, Inc.

XT V 160 - Nikon Metrology, Inc.

The XT V 160 is specifically designed for x-ray inspection in production lines and failure analysis laboratories.

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X-ray and CT System for Turbine Blade and Casting Inspection

XT H 450

Nikon Metrology, Inc.

XT H 450 - Nikon Metrology, Inc.

The XT H 450 system offers the necessary source power to penetrate through high density parts and generate a scatter-free CT volume with micron accuracy. The system is available with a flat panel or a proprietary Curved Linear Array (CLA) detector that optimizes the collection of the X-rays without capturing the undesired scattered X-rays.

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Multi-Sensor Measuring System

iNEXIV VMA-2520

Nikon Metrology, Inc.

iNEXIV VMA-2520 - Nikon Metrology, Inc.

The iNEXIV VMA-2520 is a new multi-sensor measuring system that's lightweight and compact enough to be used in the factory on the bench top, with fast, fully automatic and high accuracy features that make it ideally suited for a wide variety of industrial measuring, inspection and quality control applications. The iNEXIV is designed to measure 3D workpieces, is touch probe ready, integrates the latest imaging processing software and incorporates a new 10x optical zoom system and Laser Auto Focus option.

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Semiconductor Inspection

XT V 160R

Nikon Metrology, Inc.

XT V 160R - Nikon Metrology, Inc.

The XT V 160R is a versatile microfocus X-ray system for both manual and programmed inspection of electronics, semiconductor or small industrial samples.

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High-Precision, High-Speed Measuring of Various Samples

NEXIV VMZ-R4540

Nikon Metrology, Inc.

NEXIV VMZ-R4540 - Nikon Metrology, Inc.

The CNC Video Measuring System "NEXIV VMZ-R4540" is capable of accurately measuring the dimensions and shapes of high density and multi-layered electronic components.

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High Accuracy Metrology System

MCT225 HA

Nikon Metrology, Inc.

MCT225 HA - Nikon Metrology, Inc.

This new 'absolute-accuracy' Metrology-CT (MCT) system guarantees that all internal and external geometry is measured efficiently with the highest accuracy. A proprietary liquid cooled microfocus transmission source, a finite element optimized support frame for maximum stiffness, and air-cooled cabinet provide long-term stability.

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Laser Radar shop floor CMM

Nikon Metrology, Inc.

Nikon Metrology, Inc.

With the need for shorter and more flexible production cycles, automotive manufacturers are continuously looking to cut time and costs whilst improving product quality. The Laser Radar mounted on an industrial robot introduces an innovative approach to body-in-white (BIW) inspection. This shop floor system provides accurate, dimensional measurements in the car coordinate system allowing direct comparison to CAD without the need for a reference part. Unlike horizontal-arm CMM, its high-speed measurements fit within short production cycle times.