Bruker Nano Surfaces
From leading edge scientific research to high-speed production, Bruker provides the critical surface measurements necessary for success with the world's broadest range of AFMs, stylus profilers, mechanical testers, non-contact 3D optical microscopes, and fluorescence optical microscopes.
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Electron Microscope Analyzers
Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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Handheld/Mobile/Portable XRF Spectrometers
Handheld / portable X-ray fluorescent (XRF) analyzers have the capability to non-destructively quantify or qualify nearly any element from Magnesium to Uranium, depending on the instrument configuration.
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Nanomechanical Test Instruments for Microscopes
Bruker has developed a comprehensive suite of nanomechanical and nanotribological test instruments that operate in conjunction with powerful microscopy techniques. Combining the advantages of advanced microscopy technologies with quantitative in-situ nanomechanical characterization enables an accelerated understanding of material behavior at the nanoscale.
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Optical Emission Spectrometers
Optical emission spectrometers (OES) and the measuring principle of the atomic emission are the ideal method and provide the perfect instrumentation for metal analysis in all different industrial businesses and environments.
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Micro-XRF Spectrometers
Micro X-ray fluorescence spectrometry is the method of choice for the elemental analysis of non-homogeneous or irregularly shaped samples as well as small objects or even inclusions.
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Elemental Analyzers
Bruker manufactures instruments for elemental analysis from 100% down to the sub-ppb trace level. Easy-to-use solution packages help customers in process and quality control to meet industry norms and standards including ASTM, DIN, ISO and FDA. Highest analytical accuracy and precision enable academic research from lab to field.
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CS/ONH Analyzers
Elemental analysis of CS and ONH in inorganic materials | Based on the know-how of many decades Bruker offers innovative solutions for rapid and precise elemental analysis of carbon, sulfur, oxygen, nitrogen and hydrogen.
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TXRF Spectrometers
Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.
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Microscopes
Bruker's world-leading microscopy systems are helping scientists and engineers to make breakthrough discoveries and develop new applications and products that improve nearly all aspects of our world. Our microscopes enable scientists to explore life and materials at the molecular, cellular and microscopic levels.
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Atomic Force Microscopy
Bruker’s industry-leading AFM microscopes provide the highest levels of performance, flexibility and productivity, and incorporate the very latest advances in atomic force microscopy techniques. Applications range from materials science to biology, from semiconductors to data storage devices, from polymers to optics with measurement of nanoscale topography, nano-mechanical, nano-electrical and nanoscale chemical mapping.
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Nanomechanical Instruments for SEM/TEM
As the world leader in nanomechanical testing systems, Bruker makes it easy for you to conduct in-situ mechanical experiments in your microscope with the Hysitron PI Series PicoIndenters. Our unique transducer design delivers unmatched stability throughout your experiments, resulting in precise data even at the nanoscale.
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Stylus Profilometry
Dektak®
Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
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Nanomechanical Test Systems
Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
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3D Optical Microscopy
Bruker is the worldwide leader in 3D surface measurement and inspection, offering fast, non-contact analyses for samples ranging in size from microscopic MEMS to entire engine blocks. Our microscopes are the culmination of ten generations of proprietary Wyko® Technology advances that provide the high sensitivity and stability necessary for precision 3D surface measurements in applications and environments that are challenging for other metrology systems.
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Tribology System
UMT TriboLab™
Bruker’s Universal Mechanical Tester (UMT) platform has been the most versatile and widely used tribometer on the market since the first model debuted in 2000. Now, newly designed from the ground up, the UMT TriboLab™ builds on that legacy of versatility with a unique modular concept that harnesses more functionality than ever before—all without any compromise in performance.