OEwaves, Inc
OEwaves develops state-of-the-art technologies and provides products in support of communication, sensor, RADAR/LIDAR, stable clocking, and test and measurement systems for commercial and military markets.
- (626) 351-4200
- service@oewaves.com
- sales@oewaves.com
- 465 North Halstead St.
Suite 140
Pasadena, California 91107
United States
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product
HI-Q LASERS
Laser houses a proprietary driver/controller and the OEwaves laser source which is based on a high quality factor (Q) Whispering Gallery Mode (WGM) micro-resonator. The laser is scalable to a variety of wavelengths in 370 – 4500nm. laser leverages the self-injection locking capability of a suitable commercially available laser diode via resonant optical feedback from a high-Q WGM micro-resonator. Its monolithically integrated approach along with micro-scale mass and volume make the laser virtually insensitive to environmental vibrations.
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HI-Q® OPTO-ELECTRONIC OSCILLATORS
Opto-Electronic Oscillators (OEOs) produce spectrally-pure microwave and mm-wave signals using an opto-electronic feedback loop. The versatile scheme allows utilization of optical components for low loss and small size. It is also inherently less sensitive to vibration and acceleration and provides the same low-spectral purity at all RF frequencies (microwave to mm).
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OPTICAL PHASE NOISE TEST AND MEASUREMENT SYSTEM
OEwaves’ HI-Q® Optical Test Measurement System utilizes a homodyne methodology for automated measurement capable of testing ultra-low phase noise laser sources. The user friendly test system is capable of rapidly measuring laser phase noise and estimating its FWHM linewidth down to < 3 Hz without complex setup or reference lasers normally required to make such a narrow linewidth measurement.
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RF TEST AND MEASUREMENT SYSTEM
OE8000
RF Test Measurement System (TMS) utilizes microwave photonics techniques for automated measurement of ultra-low phase noise oscillators.
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Hi-Q W-Band Ultra Low Phase Noise Analyzer
OE8000W
HI-Q® W-Band phase noise test system utilizesmicrowave photonics techniques for automatedmeasurement of ultra-low phase noise W-bandoscillators.
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Hi-Q Laser RIN Analyzer
OE4001
The OEwaves’ HI-Q® OE4001 Optical Test Measurement System (TMS) offers a fully automated measurement of ultra-low RIN (Relative Intensity Noise) CW laser sources.
