IST Information Scan Technology, Inc.
Manufacturer of industry leading micro-electronic diagnostic test machines and home electronics
- 408.988.1908
- sales@infoscantech.com
- 487 Gianni St.
Santa Clara, CA 95054
United States
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product
Microprocessor System Tester
IST-6700
IST Information Scan Technology, Inc.
The IST 6700 is a low cost, stand-alone test instrument that provides a wide range of automatic and manual features for troubleshooting microprocessor-based circuit boards. It employs CPU emulation with low cost CPU personality pods to attach to or replace the resident CPU. With stored "Known Good" test data, the 6700 can provide fully automatic functional tests to check the system RAM, ROM, control signals, address, and data bus plus the measurement of the CPU clock frequency and supply voItage.
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Programmable Multifunction Generator
IST 5800/5850
IST Information Scan Technology, Inc.
The IST-5800 series programmable multifunction generator is an exceptionally versatile and economical instrument for applications in R&D, Manufacturing Test, Service Repair and Training. Featuring an adjustable triple output power supply and waveform generator, it has the ability to provide power and signal sources for a circuit while the universal logic probe, auto-ranging frequency counter, and digital voltmeter allows you to simultaneously analyze and measure circuit activity.
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Cable/Harness Tester
IST-380
IST Information Scan Technology, Inc.
THE IST MODEL 380 is a portable, stand-alone cable/harness tester for testing any cable up to 128 points. It detects opens, shorts, and miswires within one second by comparing the test result with the golden file or the data learned from a sample good cable. The error messages can be shown on the LCD display or printed out on a printer with the correct wire list needing reworking.
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64 MB RAM Tester
IST-6500
IST Information Scan Technology, Inc.
The IST-6500 is a low cost, fully programmable tester for functional and parametric testing of DRAM, SRAM, VRAM, and SIMM devices up to 144 bits wide and 64 MB in size. The 6500 offers four different ways to automatically measure the access time of these devices from 2ns to 160ns with a resolution of 2ns. The DRAM timing parameters are programmable at the resolution of 1ns to allow for testing DRAM, SIMM, or VRAM at their required operating speeds, thus providing real time test conditions.
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Programmable Parametric Tester For Discrete Semiconductors
IST-8800
IST Information Scan Technology, Inc.
The IST-8800 is a fully programmable, low cost tester that provides parameter measurements or parametric GO/NO GO test for transistors, diodes, MOS-FETs, Regulators, Triacs, Zeners, SCRs, and J-FETs. These devices can be tested up to 5 amps or 1200 volts with a measurement range down to the nano amp range. Only four universal test fixtures are required which can test the device across a wide range of packages.
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Programmable Parametic Tester
IST 878
IST Information Scan Technology, Inc.
The IST 878 is a low cost test instrument that provides in-circuit or out-circuit testing for a wide range of discrete semiconductors
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Semiconductor Test System
IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
