Showing results: 16 - 18 of 18 items found.
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ITC57300 -
Integrated Technology Corp.
The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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ITC55WLMD -
Integrated Technology Corp.
The ITC55WLMD series of test systems has been developed by ITC to be stand-alone UIL test systems configured specifically to test on wafer. The systems include an ITC55series UIL tester and inductor box, a current limiter module and a system controller
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ITC55100C -
Integrated Technology Corp.
The system has been designed around a very powerful micro-controller that gives it a timing resolution of 40ns, twenty times faster than the previous model. Its response time to the peak and zero current is improved ten times. Combined this gives greater accuracy for the charging and avalanche times and for the reported peak drain current.