Applied Image, Inc.
APPLIED IMAGE Inc. is a world leader in the design and manufacture of precision-imaged optical components intended for a wide range of applications and industries that require NIST-traceable standards and/or precision-imaged components to test, calibrate, align, control or measure their optical or photonics systems. In addition to its large catalog of standard products, APPLIED IMAGE specializes in designing and manufacturing custom components, imaged to the strictest tolerances. Its mission is to provide the highest-quality products and customer service to consistently meet and exceed the expectations of its customers such as NASA (Mars Rover) and Goddard (International Space Station).
- (585) 482-0300
- (585) 288-5989
- 1653 East Main Street
Rochester, NY 14609
United States
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ACCUplace Macro Calibration Standard
AP-M Series
With both X & Y axis metric scales, these dual axis targets are ideal for calibrating optical magnification in microscopes, linear distance, stage motion and squareness. In addition, with the larger area calibration scale, the calibration of low power optical systems over the longer distances can be easily carried out. The AP-M is offered on two standard materials; Glass (CG) and Opal (OP).
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SINE M-13-60 Sinusoidal Array
The Sinusoidal Array SINE M-13-60 is designed to be used for evaluating systems that work in the reflective mode such as scanners, machine vision systems and cameras. It is imaged on Photo Paper in four different sizes getting larger from 1X – 8X. The ½X and 1X slides incorporate the same spatial frequencies. Spatial frequencies for the 2X, 4X and 8X versions are 1/2, 1/4 and 1/8 respectively.
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FBI / MITRE Test Charts & Kits
FBI / MITRE Test Charts & Kits by Applied Image - FBI SIQT Scanner Test Chart, Individual Personal Identity Verification Test Charts for Single Fingerprint Capture Devices, Personal Identity Verification Kits for Single Fingerprint Devices
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AIIM Test Charts (Scanner/Microfilm/Digital/ Copier)
AIIM Test Charts (Scanner/Microfilm/Digital/ Copier) by Applied Image - Motion-Rotary Target, Planetary-Static Target, Small Area Target/AIIM MS-303-1980, Small Scanner Resolution Target , Copier Test Array, Rotary Test Target/AIIM X113, Film Strip Target, Eastman Kodak Copier/Scanner Digital Test Target, Small Color MTF Target
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Custom Optical Components and Standards
With the amount of applications that optical components have, no one could hope to have the perfect component for every possible scenario. For this reason, APPLIED IMAGE makes easy the process of designing, building, and delivering custom components to our customers. Our engineering process is designed to produce the best parts in the industry and more importantly, the best component for your specific needs. The APPLIED IMAGE experience will cover the project with expert engineers from start to finish. Use the form below to start the conversation for checkerboard and dot arrays, stage and image analysis micrometers, reticles and machine vision components.
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Image Analysis Micrometers
For calibrating and analyzing microscopy measurement systems, the IAM line of Image Analysis Micrometers are perfectly suited. Calibrated to NIST Standards, and imaged with the best line edge quality in the industry, the IAM series is a diversified line of slides that function in areas of color calibration (IAM-9C), Optical Magnification, Frame Distortion, and other applications. Custom features, substrates, sizes and designs are available as custom solutions.
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Stage Micrometer Measuring Scales
The SM Series of Stage Micrometer Calibration Standards is ideally suited for calibrating optical, imaging, video as well as reticle based measurement systems. Designed for ease of use and manufactured for durability, the SM Series has both English and Metric scales in one or two axis configurations. Our SM series covers a range of low to high power systems, and can always be custom manufactured to perfectly fit your needs.
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Image Analysis & Stage Micrometers
The APPLIED IMAGE series of Image Analysis and Stage micrometers are ideally suited for calibrating optical, imaging, video, and reticle-based measurement systems. Designed for ease of use and manufactured for durability, the SM Series has both English and Metric scales in one or two axis configurations. Both types of micrometers come with NIST traceable calibration standards and are available on multiples substrates to perfectly fit your needs. The experience APPLIED IMAGE has in manufacturing precision imaged optical components makes us the trusted source for standards for magnification system microscopy and vision applications. Should you need to alter feature patterns, size, or substrate, fill out our Custom Optical Components and Standards form to start the conversation.
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Conformance Calibration Standard Test Card for ITF-14 (Interleaved 2 of 5) Symbol Verifiers
AI-CCS-ITF-14
This test card is ideal for testing verifiers, scanners, and other ITF-14 (Interleaved 2 of 5) barcode reading equipment. It also can serve as an excellent training aid to ensure new operators are using the proper methodology and are proven competent in the use of verifiers.
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Conformance Calibration Standard Test Card for GS1-DataBar Symbol Verifiers
AI-CCS-DATABAR
This test card is ideal for testing verifiers, scanners, and other GS1-DataBar barcode reading equipment. It also can serve as an excellent training aid to ensure new operators are using the proper methodology and are proven competent in the use of verifiers.
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Conformance Calibration Standard Test Card for GS1-128 Symbol Verifiers
AI-CCS-128-E Rev B
This test card is ideal for testing of verifiers, scanners, and other GS1-128 barcode reading equipment. It also can serve as an excellent training aid to ensure new operators are using the proper methodology and are proven competent in the use of verifiers.
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ACCUplace Dot Patterns
AP-D Series
All machine vision lenses will show some type of distortion. Minimizing or correcting that distortion is crucial in most applications. The ACCUplace Dot Patterns target is designed to check, verify, or quantify barrel distortion in vision systems, alignment between multiple optical systems, and can calibrate instruments with both vision and motion systems. The indexed columns and rows of dot features provide reference points that make alignment and distortion detection simple and straightforward. The AP-D is offered on four standard materials; Glass (CG) Opal (OP) Photopaper (RM) and Film (TM).
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ACCUplace Land Pattern Plate
APLP-1
APPLIED IMAGE, in conjunction with Hewlett Packard Corp., has developed a unique, and extremely accurate, pick & place target set designed to check for accuracy and repeatability of your robotic system, quickly and easily.
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Custom Test Targets & Charts
Our customers in industries that require camera or scanner image evaluation certainly know the challenges that come from finding the perfect target for a specific system and measurement. Thankfully, we at APPLIED IMAGE know these challenges just as well. The ability to freely customize a target has proved important for our customers to get the image evaluation tools they need. Our sales engineers are experts in different types of targets and specifications that will give you the best results for your project, and will guide you through the process from start to finish.
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ACCUplace Land Pattern Kit
APKIT-1
APPLIED IMAGE, in conjunction with Hewlett Packard Corp., has developed a unique, and extremely accurate, pick & place target set designed to check for accuracy and repeatability of your robotic system quickly and easily.
