Hanwa Electronic Ind. Co.,Ltd.
- +81-73-477-4435
- +81-73-477-3445
- 689-3, Ogaito
Wakayama, 649-6272
Japan
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product
Fault Detection Device in PV String
Hanwa Electronic Ind. Co.,Ltd.
◆Very light and easy to carry.◆Possible to find fault areas that can’t find by Voc.◆Measurement Voc and Vc.◆Possible to check data and record the data using Android.
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TLP Tester lineup
Hanwa Electronic Ind. Co.,Ltd.
The tester can implement simulate operating characteristic of protective circuit In addition capable of the VFTLP test.
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CDM Tester
Hanwa Electronic Ind. Co.,Ltd.
The tester implements to test the withstand voltage which occurs when the device contact to different electric potential object.
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Wafer ESD Tester lineup
Hanwa Electronic Ind. Co.,Ltd.
◆Correspond to 300mm Wafer. This tester can measure LED or the large sizes Wafer, such as a system LSI. And Zap of HBM/MM can be performed. The Automatic destructive judging by V/I measurement can also be performed after Zap.◆Waveform guarantee in Zap needles. HED-W5100D carries out the calibration before shipment in the place of Zap needles. Therefore, Correlation of the Result of a Package Device becomes clear easily.◆Correspondence to Standards This Tester corresponds to the Standard of JEITA, ESDA, and JEDEC. A Zap unit adopts the plug-in system and also has the waveform of Customer's requests.◆Connection with TLP This Tester is the best for TLP Testing with deep relation of ESD. The protection circuit of a device with an ESD problem is investigated.
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ESD Testers
Hanwa Electronic Ind. Co.,Ltd.
◆Adaptable to the following international standard waveform;JEDEC, ESDA, AEC, and JEITA◆This system’s uniquely short discharge circuit is made possible by its original mechanical design.◆The short circuit minimizes the influence of inductance and capacitance on the data.◆The use of a single circuit ensures data stability for each device pin tested.
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LD/LED ESD Tester
Hanwa Electronic Ind. Co.,Ltd.
◆Automatic operationPerforms automatic destructive evaluation of Lazer-power after zap.After the measurement, the destruction judgment condition can be changed, and it judge again for the acquired data.◆Optical characteristic measurementThe output level of the laser diode (power) is measured by the Photodiode.After zap, it display Optical data displayed(IL), Performs the process of destruction.Settings: slope efficiency, differentiation resistance, and threshold current, etc◆Two kind LDAutomatic settings of two kinds wavelength.◆For variegated deviceThe socket (Jig) is separates. Perform to any device.The P.D. can be changed.Its height can be changed.
