ESDEMC Technology LLC
ESDEMC Technology is founded by a group of iNARTE certified professional ESD (Electrostatic Discharge) and EMC (Electromagnetic Compatibility) engineers, professors and students from MST-EMCLAB (the leading EMC research group in USA). ESDEMC Technology designs, manufactures and markets ESD and EMC related products. We are devoted to delivering creative, flexible and cost effective ESD and EMC solutions and top-level consulting services. We offer customized design services to satisfy all of our customers.
- 877-864-8479
(+1) 573-202-6411 - (+1) 877-641-9358
- info@esdemc.com
- 4000 Enterprise Drive
Suite 103
Rolla, MO 65409
United States
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Probing Solutions
ES62X-CMPS
The ES62X-CMPS compact manual probe station is a rugged wafer probing solution designed for high reliability, compact size and low investment cost. It enables manual wafer level measurements up to 300 mm wafers. The probing station can also be used for TLP, HMM, HBM, LV-Surge, RF, S-parameter and DC-measurements. Micro positioners with vacuum as well as magnetic base can be attached. The chuck has a vacuum interface for the wafer and is electrically isolated. Multiple 4 mm connectors can be used to connect a voltage potential to the wafer backside.
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Test and Analysis
ESDEMC Technology will calibrate; the Contact Mode ESD current waveform and tip voltage to 4 GHz and 30 kV, the frequency response of ESD Target & Adapter Line to 4 GHz, and the DC Resistance
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Transmission Line Pulse Testing
Transmission Line Pulse testing, or TLP testing, is a method for semiconductor characterization of Electrostatic Discharge (ESD) protection structures. In the Transmission Line Pulse test, high current pulses are applied to the pin under test (PUT) at successively higher levels through a coaxial cable of specified length. The applied pulses are of a current amplitude and duration representative of the Human Body Model (HBM) event (or a Charged Device Model – CDM – event in the case of Very Fast TLP, or VF-TLP).
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Cable Discharge Solutions
Cable Discharge Event, or CDE, is an electrostatic discharge event that occurs when a cable is connecting to a piece of equipment with different potential. It occurs because there is a potential differential between the charge on a cable to be connected and the equipment. It doesn't matter if the cable is charged or if the equipment is charged. It's the potential differential that causes the discharge. ESDEMC develops commercial system for CDE reliability test and evaluation.
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Pulsed IV-Curve Solutions
Pulsed IV-Curve Test and Analysis System is our new development for 2015. It is an advanced and compact pulsed IV-curve characterization system designed to simulate pulsed ESD events such as TLP, vf-TLP, HMM, HBM, EFT, and LV-Surge. It will monitor the transient voltage and current waveform during the pulse in ps or ns segment, and test the pre- and post-pulse status (leakage current, breakdown voltage, biasing current, static IV curve, etc) of the device under test (DUT), such as protection devices, semiconductors, circuit modules, touch panel sensor, etc.
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EMC & RF Solutions
Microwave Absorbing Material Characterization System that measures the signal loss through a material sample in a frequency range of 5 15GHz (with the option of extension to lower frequencies).
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High Voltage Measurement
High Voltage Pulse Attenuator is used to attenuate high voltage pulse signals in a 50 system. It is consist of highly surge robust components with great voltage linearity. The device is symmetrical, Input and output can be exchanged.
