Rika Denisi America
Rika Denshi America has been a leader in test probe (spring probe) development, design and manufacture for over 50 years. We offer high quality test probes and interconnect designs that will surpass most test requirements, including semiconductor test probes, battery contact, tester interface, burn-in test probes and kelvin test probes.
- +81 3 6635 0620
- +81 3 6635 0621
- info@jp.rikadenshi.com
- Mita Kokusai Building 13th floor
1-4-28 Mita,
Minato-ku, Tokyo 1080073
Japan
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Contact Probes
Rika Denshi Group Contact Probes - specialty probes including fine pitch testing, high frequency testing, high temperature testing, kelvin test, and high current test, as well as standard probes for 0.4mm-, 0.5mm-, 0.65mm-, 0.8mm-, and 1.0mm pitch.
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Probe Cards
These cards are compatible with WLCSP and can be customized according to pin positions. They can be used for a pitch of up to 180 μm. We are developing a product for a pitch of 150 μm, to be compatible with narrower pitches.
