WITec
Since its founding in 1997, WITec has established itself as a market leader in the field of nano-analytical microscope systems (Raman, AFM, SNOM). As reflected in WITec’s maxim "Focus Innovations", our success is based on constantly introducing new technologies and a commitment to maintaining customer satisfaction through high-quality, flexible and innovative products.
- +49 (0) 731 140 700
- +49 (0) 731 140 70 200
- info@WITec.de
- Lise-Meitner-Str. 6
Ulm, D-89081
Germany
Filter Results By:
Products
Applications
-
product
Confocal Micro-Raman System
alpha300 access
access is a micro-Raman single-spot analysis and mapping microscope. It was specifically engineered for budget-conscious customers with high demands on instrument performance. Its outstanding spectral quality, optical throughput and signal sensitivity are ensured by well-established WITec optical elements. The high-quality microscope setup of the access is also the basis for its full upgradability.
-
product
Spectrometer
All WITec''s Raman microscopes are operated with ultra-high throughput spectrometers (UHTS) that were distinctively developed for high speed and high resolution Raman imaging. The UHTS series comprises of six models in several focal lengths to accommodate multiple laser excitation wavelengths (UV to IR) and spectral resolution requirements.
-
product
Inverted Confocal Raman Microscope
alpha300 Ri
The alpha300 Ri turns 3D chemical characterization upside down. Its inverted beam path preserves all the functionality of WITec’s standard alpha300 confocal Raman imaging microscopes while introducing a new angle in access and handling. The ability to view and investigate samples from below is a great advantage when working with aqueous solutions and oversized samples. Studies in life sciences, biomedicine and geosciences in particular will benefit from the consistency and flexibility provided by the geometry of the alpha300 Ri.
-
product
Advanced Raman, AFM & SNOM Imaging Systems
alpha300 Series
Alpha300 series consists of advanced Raman, Atomic Force Microscopy (AFM) and Scanning Near-field Optical Microscopy (SNOM) imaging systems. Its sophisticated design ensures exceptionally high-throughput and sensitivity. A unique modularity allows for single-technique solutions as well as correlative imaging configurations.