Showing results: 1 - 5 of 5 items found.
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Mesuro Ltd
Noise Parameters: These are four numbers that fully describe the noise behaviour of an active or passive device (twoport) at a given frequency. For practical reasons we use the following quantities as Noise Parameters:
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FDCS -
Mesuro Ltd
Beyond traditional Noise and Harmonic Load/Source Pull, FDCS also supports Tuner and Fixture (TRL) calibrations, Time Domain Load Line acquisition, Pulsed IV and Load Pull and Active feedback Power Injection operations (for Γ ≥ 1).The measured data are processed graphically into 2D and 3D plots and are converted into popular simulator formats (ADS, AWR etc.).The FDCS user unterface includes many many improvements and optimizations to make load pull and noise measurement easier.The software has ActiveX control for controlling MPT tuners in any ActiveX compatible platform.
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Load Pull -
Mesuro Ltd
An impedance tuner is an apparatus, which generates controllable reflection factor (Impedance) over a certain frequency range. Focus uses two basic technologies:
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AURIGA 4850 -
Mesuro Ltd
Auriga’s 4th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.
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CARDIFF MODELS -
Mesuro Ltd
Non-linear measurement data has been exploited in various ways to create behavioral models for high frequency components. Formulations of these models have been defined in terms of traveling waves, with a desire to represent nonlinear behavior of high frequency transistors through a direct extension from linear s-parameters.
