Providing the most advanced solutions for qualitative and quantitative analytical problems where elemental and/or structural information is required. EDAX endeavors to maintain its leading position in EDS and EBSD while simultaneously growing into leadership positions in EDXRF markets. A division of Ametek.

  • 201 529 6231
  • 201-529-3156
  • info.edax@ametek.com
  • 91 McKee Drive
    Mahwah, NJ 07430
    United States

Filter Results By:



Showing recent results 1 - 15 of 15 products found.

  • Atom Probe Assist


    Atom Probe Assist provides an innovative means of monitoring grain boundary position between FIB milling steps to ensure that a grain boundary is detected and correctly positioned for subsequent Atom Probe analysis. With Atom Probe Assist, transmission-EBSD (t-EBSD) can be used to measure and image the crystallographic orientation and determine grain boundary position quickly and easily within a single instrument.

  • Pattern Region of Interest Analysis System


    PRIAS is a synergistic new imaging technique to visualize microstructure and provide exciting new views of your materials. PRIAS enables users to quickly characterize materials without requiring full EBSD pattern indexing. Through a novel use of the EBSD camera, PRIAS provides as many as 25 positional electron detectors to allow unprecedented flexibility in image collection and visualization. Applications of PRIAS include traditional EBSD materials such as metals, ceramics, semiconductors, and minerals as well as new analysis of plastics and glasses.

  • Orbis Vision Software


    The Orbis Vision software provides the user with an easy-to-use interface while allowing control for applications requiring more powerful analytical tools. Sample navigation capabilities allow for simple point and analyze, saving of multiple sample positions for automated analysis, and importation of sample images from other tools to correlate analysis between Orbis and other microanalytical tools.

  • Electron Backscatter Diffraction (EBSD) Camera

    Velocity™ - EDAX

    high-speed EBSD mapping with the highest indexing performance on real-world materials. Velocity™ EBSD camera combines indexing speeds greater than 3,000 indexed points per second with indexing success rates of 99% or better. At these speeds, the Velocity™ uses 120 x 120 pixel EBSD patterns for improved band detection. This image resolution, combined with proven EDAX triplet indexing routines, provides orientation precision values of less than 0.1°.

  • EBSD tools


    EDAX EBSD tools provide leading performance and groundbreaking technology for analyzing crystallographic microstructure, using electron backscatter diffraction in the SEM.

  • Analysis System


    The addition of Wavelength Dispersive Spectrometry (WDS) to the TEAM Analysis System streamlines three microanalysis routines - energy dispersive spectroscopy (EDS), electron backscatter diffraction (EBSD) and WDS - into one interface and provides the maximum materials insight quickly and easily.

  • Energy Dispersive Spectroscopy (EDS) Platform

    Octane Elect EDS System - EDAX

    The Octane Elect EDS System is an enhanced Energy Dispersive Spectroscopy (EDS) platform with the latest advancements in Silicon Drift Detector (SDD) technology and high speed electronics. Tailored for users who demand higher performance and functionality than the options available in entry-level systems, the Octane Elect EDS System provides excellent resolution and high throughput at an optimal value with a remarkable low energy sensitivity for light element detection and low voltage (kV) microanalysis.

  • Silicon Drift Detector (SDD) Analyzer

    Orbis PC - EDAX

    The Orbis PC Silicon Drift Detector (SDD) Analyzer is an upgraded model that is exceptionally well suited to analyze smaller samples or make faster measurements. The instrument is delivered with an advanced, LN-Free X-ray silicon drift detector (SDD), enhanced color video camera with 3x digital zoom, and a 30 m polycapillary lens. The Orbis PC SDD's sample positioner has an upgraded XYZ stage with higher-precision sample positioning.

  • Energy Dispersive Spectroscopy (EDS) Detector Technology

    EDS - EDAX

    The Element SDD is a solutions based detector, which excels at basic analysis. Focused primarily on serving the needs of the industrial market segment, it provides application specific software and analysis that can quickly provide answers in the industrial environment.

  • Silicon Drift Detector

    Octane Elite (SDD) Series - EDAX

    The game changing advancements in the Octane Elite Silicon Drift Detector (SDD) Series take detector technology to the next level. This line of detectors incorporates a new silicon nitride (Si3N4) window, which offers remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite Series also uses the widely praised CUBE technology, which yields high speed X-ray data processing within a smaller and fully vacuum encapsulated detector device.

  • TEAM EDS Analysis System for TEM


    TEAM EDS Analysis System featuring the Octane Silicon Drift Detector (SDD) Series for Transmission Electron Microscope (TEM) provides the ultimate analytical solution for TEM. The systems are offered for TEMs and STEMs with Smart Features to make them more intuitive and easier to use. The workflow functions are automated by integrating years of EDAX knowledge and expertise to work for you. Startup, analysis, and reporting are easy because the TEAM EDS software automates each task. It is the only EDS technology that combines smart decision making and guidance for the novice with advanced features for the experienced user. Now you have the intelligence of an EDS expert every step of the way.

  • XRF Analyzer


    The XLNCE SMX-BEN is a benchtop Energy Dispersive X-ray Fluorescence (EDXRF) analyzer that provides non-destructive, composition and coating thickness measurement and analysis on virtually all materials. It is an excellent choice for R&D, process development, process control, and failure analysis.

  • XRF In-Line Analyzer


    X-ray Fluorescence (XRF) analysis is a powerful qualitative and quantitative tool ideally suited to the analysis of film thickness and composition, determination of elemental concentration by weight of solids and solutions, and identification of specific and trace elements in complex sample matrices. The SMX-ILH XRF system is a process control and yield management platform that offers integrated and remote module configurations for in-line atmospheric analysis of coating composition and thickness measurements of rigid and flexible substrates. This system allows the movement of coated material through the measuring enclosure for full panel analysis either in static or across the gradient locations through a motorized, programmable single or dual integrated measuring module.

  • The Ease of TEAM with the Power of Orientation Imaging Microscropy (OIM)

    TEAM™ Pegasus - EDAX

    Introducing the new EDS and EBSD Integrated System

  • Transition Element X-ray Spectrometer


    The TEXS HP is a parallel beam spectrometer (PBS) employing capillary optics (replacing the high collection optics (HCO)), which give the spectrometer an energy range from 150 eV to 10 keV (B K to Cu K). The TEXS is optimized to cover low energy and transition element energies.