Olympus Corp.

Manufacture and sales of precision machineries and instruments.

  • (81) 3-3340-2111
  • Shinjuku Monolith, 3-1 Nishi-Shinjuku
    2-chome
    Shinjuku-ku, Tokyo 163-0914
    Japan

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Showing results: 1 - 15 of 35 items found.

  • Cleanliness Inspection System / Microscope

    CIX90 - Olympus Corp.

    The OLYMPUS CIX90 technical cleanliness inspection system is a dedicated, turnkey solution for manufacturers who maintain high quality standards for the cleanliness of manufactured components. The OLYMPUS CIX90 system makes it easy to quickly acquire, process, and document technical cleanliness inspection data to comply with international standards. The system is intuitively designed to guide users through each step of the process so that even novice inspectors can acquire important cleanliness data quickly and easily.

  • Color and Monochrome Camera

    DP74 - Olympus Corp.

    The DP74 color camera for fluorescence not only advances the speed and ease with which you can obtain detailed, accurate images but also introduces for the first time the concept of Intelligent Imaging. With Intelligent Imaging, the camera analyzes the live image and automatically applies its technology to reduce processing time and produce quality images of even dim and challenging samples. Furthermore the camera can follow your stage movements to create in real-time a panoramic image with mapped zoom-outs, a great time saver for documenting your sample. The DP74’s wide field of view and unsurpassed live speed provide an on-screen experience closely matching the traditional ocular view, thanks to its expertly calibrated colors. Maximize your investment return on a shared laboratory instrument with the camera’s top resolution of 20.7 megapixels and the capability to work with brightfield and fluorescent samples alike. These features are compatible with any microscope, whether manual or motorized, making the DP74 a perfect solution for a smarter and faster imaging workflow.

  • Digital Color Camera for Microscopy

    LC30 - Olympus Corp.

    The LC30 is a 3.1 megapixel digital color camera for microscopy that combines versatility with performance. The LC30 is the ideal entry-level microscope camera for quality bright-field imaging - suitable for material science applications. The Olympus LC30 color camera for microscopy combines versatility with performance. With up to 37 frames per second (fps), faithful color reproduction, full integration into Olympus imaging platforms, and an excellent cost-performance ratio, the LC30 is the ideal entry-level microscope camera for quality bright-field imaging - suitable for material science applications.. The sensitivity and frame rate of the 3.1-megapixel CMOS chip can be increased using various binning modes, resulting in easy observation and focusing. The LC30 camera can be quickly and easily mounted on all microscopes equipped with a standard C-mount adaptor, and requires only a single USB 2.0 cable for high-speed data transfer and power supply. Its complete integration into the OLYMPUS Stream imaging platforms helps ensure the seamless interaction of microscope, camera, and additional devices, delivering intuitive and efficient operation.

  • Hall Effect Thickness Gage

    Magna-Mike 8600 - Olympus Corp.

    The Magna-Mike® 8600 is a portable thickness gage that uses a simple magnetic method to make reliable and repeatable measurements on nonferrous materials. Operation of the Magna-Mike is very simple. Measurements are made when its magnetic probe is held or scanned on one side of the test material and a small target ball (or disk or wire) is placed on the opposite side or dropped inside a container.

  • Industrial Microscope for Materials Science & Industrial Applications

    BX53M - Olympus Corp.

    Designed with modularity in mind, the BX3M series provide versatility for a wide variety of materials science and industrial applications. With improved integration with OLYMPUS Stream software, the BX3M provides a seamless workflow for standard microscopy and digital imaging users from observation to report creation.

  • Inspection System

    CIX100 - Olympus Corp.

    The OLYMPUS CIX100 inspection system is a dedicated, turnkey solution for manufactures who maintain the highest quality standards for the cleanliness of manufactured components. Quickly acquire, process, and document technical cleanliness inspection data to comply with company and international standards. The system’s intuitive software guides users through each step of the process so even novice operators can acquire cleanliness data quickly and easily.

  • Inverted Metallurgical Microscope

    GX53 - Olympus Corp.

    Designed for use in the steel, automotive, electronics, and other manufacturing industries, the GX53 microscope delivers crisp images that can be difficult to capture using conventional microscopy observation methods. When combined with OLYMPUS Stream image analysis software, the microscope streamlines the inspection process from observation to image analysis and reporting.

  • Laser Scanning Microscope

    OLS4100 - Olympus Corp.

    The LEXT OLS4100 is a Laser Scanning Microscope to perform non-contact 3D observations and measurements of surface features at 10 nanometer resolutions. It also features a fast image acquisition and a high-resolution image over a wider area.

  • Laser Scanning Microscopes

    Olympus Corp.

    The Olympus FLUOVIEW confocal microscopes are designed for high-resolution, confocal observation of both fixed and living cells, enabling visualization deep within samples. From the New FV3000, optimized for the most robust interactive live cell and tissue experiments, to easy-to-use high content imaging, explore the wide range of options with Olympus exclusive optical technologies.

  • Micro Spectrophotometer

    USPM-RU III - Olympus Corp.

    The USPM-RU III is a reflectometer that provides highly accurate spectral reflectivity measurements of small, curved, and thin samples without interference from rear surface-reflected light. The curved surface of the lens can be measured from a minute spot as small as ø60 µm formed on the sample surface. This provides the ability to use a goniometer to examine even the curved side lenses or other optical component.

  • Mining and Geochemistry Handheld XRF Analyzer

    Olympus Corp.

    DELTA Mining & Geochemistry Handheld XRF Analyzers provide immediate results to help determine the next course of action for the entire process - exploration, ore grade/process control, environmental sustainability. On-site detection of metals, minerals & contaminants. GPS-GIS-XRF for instant metal mapping, time, cost savings

  • Portable Flaw Detector

    EPOCH 6LT - Olympus Corp.

    Portable and easy to use, the EPOCH 6LT flaw detector is an ergonomic, rugged instrument that delivers user comfort and more uptime. Weighs just 1.95 pounds (890 g) with a grip-oriented weight distribution for one-handed operation with minimal wrist fatigue. Rotary knob and simple button design make it easy to use, even when wearing gloves. Engineered to IP65/67 and drop tested. Clear, bright screen for readable A-scans in any light. The EPOCH 6LT flaw detector’s workflow is simple and straightforward. Despite the instrument’s small size, it has the features and functions to meet the requirements of nearly any conventional ultrasonic inspection application.

  • Precious Metals Handheld XRF Analyzer

    Olympus Corp.

    The DELTA Precious Metals XRF Analyzer provides fast, accurate alloy chemistry and karat classification with one nondestructive, non intrusive test. Whether importing precious metals, selling or producing jewelry, or processing scrap metal, Innov-X XRF is the ideal choice.

  • Scrap Handheld XRF Analyzer

    DELTA - Olympus Corp.

    DELTA Scrap Sorting Handheld XRF Analyzers provide reliable ID in 1-2 seconds for most alloy grades and pure metals. They are designed for durability to withstand the toughest processing environments. Get fast, reliable alloy sorting and analysis for a wide variety of ferrous and non-ferrous materials in seconds.

  • Semiconductor / FPD Inspection Microscope

    MX61L - Olympus Corp.

    Motorized Microscope for 300mm dia. Wafer/17 inch Glass Substrate use Reflected/Transmitted Illumination.

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