Showing results: 1 - 6 of 6 items found.
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LS -
inTEST Corporation
Manage the rapidly changing production environment and achieve the lowest cost of test, converting between probe, final, engineering and service positions with ease. Rapid advancements in semiconductor test technology have resulted in highly efficient test cells, capable of device test throughputs far greater than ever before.
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LSC -
inTEST Corporation
The LSC is a versatile universal manipulator, compatible with probers, vertical plane handlers, and dock-from-below test systems.
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inTEST Corporation
The primary element of the tester electrical interface is the Probe Pin Ring (PPR). Sometimes referred to as a ‘tower,’ this array of spring-loaded probes can be arranged to provide a controlled impedance path, a low leakage connection, a low inductance arrangement for high currents, or just about any connection characteristic you require. inTEST EMS provides electrical interfaces in various OEM-supported designs, inTEST standards, and custom configurations.
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Cobal 250 -
inTEST Corporation
The Cobal 250 offers the best-in-class range of motion for universal manipulators with seven degrees of motion. Separate linear movements make it easier for the operator to dock, undock, and redock the test head in seconds. In combination with inTEST EMS docking, the Cobal 250 is compatible with testers for both Wafer Sort and Final Test, minimizing the time and cost when moving a tester between Sort and Final Test.
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LSP -
inTEST Corporation
The LSP mounts to standard prober hinge mounts with easy access to service and engineering locations. This reduces the floor space per test cell, saving you significant capital expenses. And you’ll be able to quickly and easily set up your ATE to wafer probe.
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inTEST Corporation
inTEST EMS Manipulators let you change test set-ups quickly for dramatically improved uptime and increased ATE utilization rates to reduce your test cost. inTEST EMS Manipulators give you industry-leading set-up speed for lower test cost, fast return on investment, and maximum test floor productivity.