Angstrom Sun Technologies Inc., headquartered in Boston, USA, is a privately held company specializing in affordable optical solutions. Our focus is on providing cost-effective tools for characterizing various parameters such as thin film thickness, thick coating thickness, wafer thickness, gap thickness, optical properties (refractive index N and extinction coefficient K), surface behavior, interface behavior, alloy concentrations, and their uniformities across surfaces.Our range of tools includes spectroscopic reflectometers, microspectrophotometers, microreflectometers, film thickness mapping systems, simple desktop film thickness stations, and automatic variable angle spectroscopic ellipsometers, as well as wafer and gap thickness tools. These tools are designed to offer advanced and high-performance capabilities at a low cost, allowing nondestructive and precise probing of film stacks and wafers. Additionally, we provide advanced analytical services for characterizing thin films, thick coatings, complex layer stacks, wafer thickness, TTV (Total Thickness Variation), and gap thickness. We also offer various vision products with USB directshow, USB3 vision, GigE, and GenTL compatible cameras.
