Wide Measurement Range Model Of Semi-automatic 4 Point Probe Sheet Resistance/resistivity Measurement

RT-3000/RG-2000 (RG-3000) - NAPSON Corp.

*User programable measurement pattern & programmable measuring pattern
*Tester self-test function, wide measuring range
*Thickness, edge, temperature correction for silicon wafer
*Film thickness conversion function from sheet resistance
*2 types measuring tester (S version: Standard type, H version: High range resistivity measurement type)