Semi-Automatic Probe Sheet Resistance/Resistivity Measurement
CRESBOX - NAPSON Corp.
• Multi-points measurement and Mapping display
- 2-D map / 3-D map graphic display
- Multipoint pattern measurement is programmed (maximum 1225 points) and random pattern is programmable by operator.
• Film thickness conversion function from sheet resistance
• Measurement data base link with Excel via CSV format file
• Software language can be switched in English /Japanese by operator