
Wafer Probe Loadboards/PIB
DTS has a full line of standard PIBs for all major tester platforms. Custom PIB designs can accommodate any test head, prober and manipulator configuration, including probe card changers, overhead direct dock setups and cable interfaces. DTS wafer test loadboards are compatible with a variety of pogo pin interface towers. All PIBs are constructed with impedance control, precision matched line lengths, full power and ground planes and both analog and digital resources to provide high quality signal integrity directly to the device.
Topics
- Wafer Probes
- Probes
- Wafer
- Probe Card Interfaces
- Design For Test
- Line Impedance
- Overhead Line
- Power Line
- Probe Interfaces
- Test Cards
- Test Heads
- Test Platform
- Test Probes
- Analog Digital
- Cable Testers
- Ground Testers
- Impedance Testers
- Pogo Pin
- Power Quality
- Power Testers
- Probe Cards
- Signal Integrity
- Spring Probes
- Wafer Probers
- Interfaces
- Line
- Test
- Analog
- Cables
- Cards
- Control
- Digital
- Ground
- Heads
- Impedance
- Integrity
- Power
- Probers
- Quality
- Signal
- Standards
- Testers