![X-ray Diffraction and Elemental Analysis](https://d27wgn5g4t3wja.cloudfront.net/img/a4ce6bfc-1422-08df-aa08-a3824347fa7f/142164.png)
X-ray Diffraction and Elemental Analysis
NANOSTAR - Bruker Optics (Bruker)
In fact, the NANOSTAR analyzes pure sample properties, even for non-isotropic sample systems. The modular design permits setting the detector-to-sample distance from 11.5 mm up to 1070 mm. Hence, the entire range from SAXS to WAXS can be covered in combination with the Image Plate (IP) option simultaneously.