High Voltage Test System
CKT1175-15 - CK Technologies, Inc. (CK Technologies, Inc.)
12.5 mV – 2000 VDC
IR measurements to 5000 megohms
Hipot testing
Dwell time prog. from 1 ms to 1000s in 1 ms steps
CKT1175-15 - CK Technologies, Inc. (CK Technologies, Inc.)
12.5 mV – 2000 VDC
IR measurements to 5000 megohms
Hipot testing
Dwell time prog. from 1 ms to 1000s in 1 ms steps
