Dynamic Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card

Dynamic Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card

The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).

Digital I/O

Format: PXI

Subcomponents

  • VHDCI (Female): Quantity: 1 Connector Positions: 68

  • VHDCI (Female): Quantity: 1 Connector Positions: 68

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