Vertical Probe Cards
The patent-pending B3™ structure requires a minimum number of parts and can handle up to 300 probes. This vertical technology can provide:
• Increased Uptime
• Extended Probe Lifetime
• Reduced Maintenance
• Lower Cost of Test
The B3™ is an ideal solution for testing small pads and the low force probes minimize scrub. Planarity also remains stable over time increasing probe card life. Contact your sales representative to learn more about our B3™ probe cards.
