
Dynamic Digital I/O With Per Channel Timing, Programmable Logic Levels And PMU PXI Card
GX5296 - Marvin Test Solutions, Inc.
The GX5296 offers advanced dynamic digital I/O performance and capabilities in a single slot, 3U PXI format. The 32-channel, GX5296 features timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability to emulate and test complex digital busses for system, board or device test applications. Offering sub-nanosecond edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform both DC and AC parametric testing. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
Digital I/O
Format: PXI
Subcomponents
VHDCI (Female): Quantity: 1 Connector Positions: 68
VHDCI (Female): Quantity: 1 Connector Positions: 68
Topics
- Digital I/O
- Digital
- Polarization Extinction Ratio
- Phasor Measurement Units
- Level
- PXI
- Timing
- Cards
- Logic
- Test Systems
- Device Under Test
- Data Test Sets
- Parallel Digital I/O
- System Level Test
- Unit Under Test
- Parametric Test
- Board Test
- System Test
- Test Applications
- Test Boards
- Test Sets
- Load Boards
- Performance Testing
- Unit Testing
- Test
- DC
- Drives
- Measurement
- AC
- Alternating Current
- Boards
- Data
- DUT
- EDGE
- Loads
- Parallel
- Sequencers
- Systems
- Testing
- Time
- Voltage
Found in Solutions brought to you by our partner VPC CSS
- GX5296 - Marvin Test PXI Digital I/O - 2ft Cable to VPC PCB Adapter - QuadraPaddle 192 (Digital I/O PCB Adapter Solution)