Electrical Testing Services
Integra provides extensive experience with complex test development: Digital & Mixed Signal Devices: Microprocessor, Microcontrollers DSP, ASIC. Linear: DAC, ADC, Operational Amplifier, Comparator, Multiplexer, Interface, Discrete. Memory: SDRAM, DDR, SRAM, SSRAM, Flash, EEPROM, EPROM. Logic: 74xxx, 16/32-bit, ECL. RF, 8GHz typical and experience to 50GHz: PA, LNA, Filter, Mixer. Expertise in developing test plans (semi mfgr production & device characterization)
Topics
- Electrical
- Services
- Testing
- Flash Memory
- DDR Test
- Device Characterization
- Discrete Device
- Flash Device
- Memory Device
- SDRAM Test
- Test Development
- Filter / Amplifiers
- Linear Amplifiers
- Mixed Signal
- Op Amps
- RF Amplifiers
- RF Multiplexers
- Test
- ADC
- Amplifiers
- ASIC
- Characterization
- DAC
- DDR
- Development
- Digital
- DSP
- EPROM
- Filters
- Interfaces
- Logic
- Memory
- Microcontroller
- Microprocessor
- Mixers
- Multiplexers
- RF
- ROM
- SDRAM
- Semi
- Signal
- SRAM
